TY - GEN
T1 - High throughput partially-parallel irregular LDPC decoder based on delta-value message-passing schedule
AU - Ji, Wen
AU - Li, Xing
AU - Ikenaga, Takeshi
AU - Goto, Satoshi
PY - 2008/9/5
Y1 - 2008/9/5
N2 - In this paper, we propose a partially-parallel decoder architecture for irregular LDPC code targeting high throughput applications. The proposed decoder is based on a novel delta-value message-passing algorithm to facilitate the decoding throughput by removing redundant computations using the difference between the updated value and the original value. Techniques such as binary sorting, high performance pipelining are used to further speed up the message-passing procedure. The synthesis result in TSMC 0.18 CMOS technology shows that for (648,324) irregular LDPC code, our decoder can increase 8 times in throughput, which reaches 418 Mbps at the frequency of 200MHz.
AB - In this paper, we propose a partially-parallel decoder architecture for irregular LDPC code targeting high throughput applications. The proposed decoder is based on a novel delta-value message-passing algorithm to facilitate the decoding throughput by removing redundant computations using the difference between the updated value and the original value. Techniques such as binary sorting, high performance pipelining are used to further speed up the message-passing procedure. The synthesis result in TSMC 0.18 CMOS technology shows that for (648,324) irregular LDPC code, our decoder can increase 8 times in throughput, which reaches 418 Mbps at the frequency of 200MHz.
UR - http://www.scopus.com/inward/record.url?scp=50649083950&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=50649083950&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2008.4542452
DO - 10.1109/VDAT.2008.4542452
M3 - Conference contribution
AN - SCOPUS:50649083950
SN - 9781424416172
T3 - 2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT
SP - 220
EP - 223
BT - 2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT
T2 - 2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT
Y2 - 23 April 2008 through 25 April 2008
ER -