Highly reliable buried-stripe type 980 nm laser diodes for practical optical communications

Hideyoshi Horie, Hirotaka Ohta, Yoshitaka Yamamoto, Nobuhiro Arai, Brian Kelly, Toshinari Fujimori, Hideki Gotoh, Masashi Usami, Yuichi Matsushima

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Citations (Scopus)

Abstract

We have developed high power and highly reliable single-mode 980 nm laser diodes (LDs) as an excitation light source for erbium doped fiber amplifiers (EDFAs) for practical communication usage. We designed buried-stripe type 980 nm LDs with a weakly index guided structure to maintain a stable single transverse mode even in high power output operation. Regarding the typical initial device characteristics, a kink level of 315±15 mW was realized and the devices showed maximum light output powers of over 550 mW at 25 °C and complete thermal rollover characteristics measured at temperatures up to 150 °C with 800 mA current injection. In electrostatic discharge (ESD) tests, no significant change of light output and/or voltage versus current characteristics after forward bias discharges typically up to about +12 kV and reverse up to -30 kV (equipment limitation) was found. Regarding the reliability, we carried out long-term aging tests at 120 mW light output power at 50 °C. In the tests, we confirmed no sudden failure and very stable spectral characteristics. In addition, we obtained similar degradation rates over different device groups. Furthermore, 150-250 mW light output aging tests also showed stable operation. The characteristics of these devices make them suitable for practical communication applications.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages280-292
Number of pages13
Volume3945
Publication statusPublished - 2000
Externally publishedYes
EventLaser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging and Reliability of Semiconductor Laseer V - San Jsoe, CA, USA
Duration: 2000 Jan 252000 Jan 26

Other

OtherLaser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging and Reliability of Semiconductor Laseer V
CitySan Jsoe, CA, USA
Period00/1/2500/1/26

Fingerprint

Optical communication
optical communication
Semiconductor lasers
semiconductor lasers
output
Aging of materials
Electrostatic discharge
communication
Erbium doped fiber amplifiers
Communication
Current voltage characteristics
Light sources
erbium
light sources
Degradation
amplifiers
electrostatics
injection
degradation
fibers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Horie, H., Ohta, H., Yamamoto, Y., Arai, N., Kelly, B., Fujimori, T., ... Matsushima, Y. (2000). Highly reliable buried-stripe type 980 nm laser diodes for practical optical communications. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3945, pp. 280-292). Society of Photo-Optical Instrumentation Engineers.

Highly reliable buried-stripe type 980 nm laser diodes for practical optical communications. / Horie, Hideyoshi; Ohta, Hirotaka; Yamamoto, Yoshitaka; Arai, Nobuhiro; Kelly, Brian; Fujimori, Toshinari; Gotoh, Hideki; Usami, Masashi; Matsushima, Yuichi.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3945 Society of Photo-Optical Instrumentation Engineers, 2000. p. 280-292.

Research output: Chapter in Book/Report/Conference proceedingChapter

Horie, H, Ohta, H, Yamamoto, Y, Arai, N, Kelly, B, Fujimori, T, Gotoh, H, Usami, M & Matsushima, Y 2000, Highly reliable buried-stripe type 980 nm laser diodes for practical optical communications. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3945, Society of Photo-Optical Instrumentation Engineers, pp. 280-292, Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging and Reliability of Semiconductor Laseer V, San Jsoe, CA, USA, 00/1/25.
Horie H, Ohta H, Yamamoto Y, Arai N, Kelly B, Fujimori T et al. Highly reliable buried-stripe type 980 nm laser diodes for practical optical communications. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3945. Society of Photo-Optical Instrumentation Engineers. 2000. p. 280-292
Horie, Hideyoshi ; Ohta, Hirotaka ; Yamamoto, Yoshitaka ; Arai, Nobuhiro ; Kelly, Brian ; Fujimori, Toshinari ; Gotoh, Hideki ; Usami, Masashi ; Matsushima, Yuichi. / Highly reliable buried-stripe type 980 nm laser diodes for practical optical communications. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3945 Society of Photo-Optical Instrumentation Engineers, 2000. pp. 280-292
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