History-Based Test Case Prioritization for Black Box Testing Using Ant Colony Optimization

Tadahiro Noguchi, Hironori Washizaki, Yoshiaki Fukazawa, Atsutoshi Sato, Kenichiro Ota

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    17 Citations (Scopus)

    Abstract

    Test case prioritization is a technique to improve software testing. Although a lot of work has investigated test case prioritization, they focus on white box testing or regression testing. However, software testing is often outsourced to a software testing company, in which testers are rarely able to access to source code due to a contract. Herein a framework is proposed to prioritize test cases for black box testing on a new product using the test execution history collected from a similar prior product and the Ant Colony Optimization. A simulation using two actual products shows the effectiveness and practicality of our proposed framework.

    Original languageEnglish
    Title of host publication2015 IEEE 8th International Conference on Software Testing, Verification and Validation, ICST 2015 - Proceedings
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Print)9781479971251
    DOIs
    Publication statusPublished - 2015 May 5
    Event8th IEEE International Conference on Software Testing, Verification and Validation, ICST 2015 - Graz, Austria
    Duration: 2015 Apr 132015 Apr 17

    Other

    Other8th IEEE International Conference on Software Testing, Verification and Validation, ICST 2015
    CountryAustria
    CityGraz
    Period15/4/1315/4/17

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    Keywords

    • Ant colony optimization
    • Black box testing
    • Test case prioritization

    ASJC Scopus subject areas

    • Software

    Cite this

    Noguchi, T., Washizaki, H., Fukazawa, Y., Sato, A., & Ota, K. (2015). History-Based Test Case Prioritization for Black Box Testing Using Ant Colony Optimization. In 2015 IEEE 8th International Conference on Software Testing, Verification and Validation, ICST 2015 - Proceedings [7102622] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICST.2015.7102622