How does defect removal activity of developer vary with development experience?

Reou Ando, Seiji Sato, Chihiro Uchida, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Masanobu Kanazawa, Kazutaka Sone, Katsushi Namba, Mikihiko Yamamoto

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)

    Abstract

    Because developers significantly impact software development projects, many researchers have studied developers as a means to improve the quality of software. However, most works have examined developers in a single project, and research involving multiple projects has yet to be published. Herein we propose an analysis method which investigates whether an evaluation of developers based on individual experience is feasible when targeting more than one project by the same organization transversely. Our method deals with the logs of the version control system and the bug tracking system. To support this method, we also propose two models to evaluate developer, the defect removal overhead rate (DROR) and developer's experience point (EXP). The results reveal the following. 1) DROR cannot be used to compare different projects in the same organization. 2) There is certainly a difference in DROR's between experienced and inexperienced developers. 3) EXP should be a useful model to evaluate developers as the number of projects increases. The data obtained from our method should propose the personnel distribution measures within the development framework for future developments, which might lead to improve the quality of software.

    Original languageEnglish
    Title of host publicationProceedings of the International Conference on Software Engineering and Knowledge Engineering, SEKE
    PublisherKnowledge Systems Institute Graduate School
    Pages540-545
    Number of pages6
    Volume2015-January
    ISBN (Print)1891706373
    DOIs
    Publication statusPublished - 2015
    Event27th International Conference on Software Engineering and Knowledge Engineering, SEKE 2015 - Pittsburgh, United States
    Duration: 2015 Jul 62015 Jul 8

    Other

    Other27th International Conference on Software Engineering and Knowledge Engineering, SEKE 2015
    CountryUnited States
    CityPittsburgh
    Period15/7/615/7/8

    Fingerprint

    Defects
    Software engineering
    Personnel
    Control systems

    ASJC Scopus subject areas

    • Software

    Cite this

    Ando, R., Sato, S., Uchida, C., Washizaki, H., Fukazawa, Y., Inoue, S., ... Yamamoto, M. (2015). How does defect removal activity of developer vary with development experience? In Proceedings of the International Conference on Software Engineering and Knowledge Engineering, SEKE (Vol. 2015-January, pp. 540-545). Knowledge Systems Institute Graduate School. https://doi.org/10.18293/SEKE2015-221

    How does defect removal activity of developer vary with development experience? / Ando, Reou; Sato, Seiji; Uchida, Chihiro; Washizaki, Hironori; Fukazawa, Yoshiaki; Inoue, Sakae; Ono, Hiroyuki; Hanai, Yoshiiku; Kanazawa, Masanobu; Sone, Kazutaka; Namba, Katsushi; Yamamoto, Mikihiko.

    Proceedings of the International Conference on Software Engineering and Knowledge Engineering, SEKE. Vol. 2015-January Knowledge Systems Institute Graduate School, 2015. p. 540-545.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Ando, R, Sato, S, Uchida, C, Washizaki, H, Fukazawa, Y, Inoue, S, Ono, H, Hanai, Y, Kanazawa, M, Sone, K, Namba, K & Yamamoto, M 2015, How does defect removal activity of developer vary with development experience? in Proceedings of the International Conference on Software Engineering and Knowledge Engineering, SEKE. vol. 2015-January, Knowledge Systems Institute Graduate School, pp. 540-545, 27th International Conference on Software Engineering and Knowledge Engineering, SEKE 2015, Pittsburgh, United States, 15/7/6. https://doi.org/10.18293/SEKE2015-221
    Ando R, Sato S, Uchida C, Washizaki H, Fukazawa Y, Inoue S et al. How does defect removal activity of developer vary with development experience? In Proceedings of the International Conference on Software Engineering and Knowledge Engineering, SEKE. Vol. 2015-January. Knowledge Systems Institute Graduate School. 2015. p. 540-545 https://doi.org/10.18293/SEKE2015-221
    Ando, Reou ; Sato, Seiji ; Uchida, Chihiro ; Washizaki, Hironori ; Fukazawa, Yoshiaki ; Inoue, Sakae ; Ono, Hiroyuki ; Hanai, Yoshiiku ; Kanazawa, Masanobu ; Sone, Kazutaka ; Namba, Katsushi ; Yamamoto, Mikihiko. / How does defect removal activity of developer vary with development experience?. Proceedings of the International Conference on Software Engineering and Knowledge Engineering, SEKE. Vol. 2015-January Knowledge Systems Institute Graduate School, 2015. pp. 540-545
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