How does defect removal activity of developer vary with development experience?

Reou Ando, Seiji Sato, Chihiro Uchida, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Masanobu Kanazawa, Kazutaka Sone, Katsushi Namba, Mikihiko Yamamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Because developers significantly impact software development projects, many researchers have studied developers as a means to improve the quality of software. However, most works have examined developers in a single project, and research involving multiple projects has yet to be published. Herein we propose an analysis method which investigates whether an evaluation of developers based on individual experience is feasible when targeting more than one project by the same organization transversely. Our method deals with the logs of the version control system and the bug tracking system. To support this method, we also propose two models to evaluate developer, the defect removal overhead rate (DROR) and developer's experience point (EXP). The results reveal the following. 1) DROR cannot be used to compare different projects in the same organization. 2) There is certainly a difference in DROR's between experienced and inexperienced developers. 3) EXP should be a useful model to evaluate developers as the number of projects increases. The data obtained from our method should propose the personnel distribution measures within the development framework for future developments, which might lead to improve the quality of software.

Original languageEnglish
Title of host publicationProceedings - SEKE 2015
Subtitle of host publication27th International Conference on Software Engineering and Knowledge Engineering
PublisherKnowledge Systems Institute Graduate School
Pages540-545
Number of pages6
ISBN (Electronic)1891706373
DOIs
Publication statusPublished - 2015 Jan 1
Event27th International Conference on Software Engineering and Knowledge Engineering, SEKE 2015 - Pittsburgh, United States
Duration: 2015 Jul 62015 Jul 8

Publication series

NameProceedings of the International Conference on Software Engineering and Knowledge Engineering, SEKE
Volume2015-January
ISSN (Print)2325-9000
ISSN (Electronic)2325-9086

Other

Other27th International Conference on Software Engineering and Knowledge Engineering, SEKE 2015
CountryUnited States
CityPittsburgh
Period15/7/615/7/8

ASJC Scopus subject areas

  • Software

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  • Cite this

    Ando, R., Sato, S., Uchida, C., Washizaki, H., Fukazawa, Y., Inoue, S., Ono, H., Hanai, Y., Kanazawa, M., Sone, K., Namba, K., & Yamamoto, M. (2015). How does defect removal activity of developer vary with development experience? In Proceedings - SEKE 2015: 27th International Conference on Software Engineering and Knowledge Engineering (pp. 540-545). (Proceedings of the International Conference on Software Engineering and Knowledge Engineering, SEKE; Vol. 2015-January). Knowledge Systems Institute Graduate School. https://doi.org/10.18293/SEKE2015-221