Abstract
Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.
| Original language | English |
|---|---|
| Article number | 5512687 |
| Pages (from-to) | 1294-1299 |
| Number of pages | 6 |
| Journal | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
| Volume | 29 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 2010 Aug 1 |
Keywords
- Design for testability
- transition delay testing
- transitional delay test coverage
ASJC Scopus subject areas
- Software
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering
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Cite this
Shi, Y., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2010). Improved launch for higher TDF coverage with fewer test patterns. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 29(8), 1294-1299. [5512687]. https://doi.org/10.1109/TCAD.2010.2047475