Improved launch for higher TDF coverage with fewer test patterns

Youhua Shi; Nozomu Togawa; Masao Yanagisawa; Tatsuo Ohtsuki

doi:10.1109/TCAD.2010.2047475

Improved launch for higher TDF coverage with fewer test patterns

Youhua Shi^*, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

^*Corresponding author for this work

School of Fundamental Science and Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.

Original language	English
Article number	5512687
Pages (from-to)	1294-1299
Number of pages	6
Journal	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume	29
Issue number	8
DOIs	https://doi.org/10.1109/TCAD.2010.2047475
Publication status	Published - 2010 Aug 1

Keywords

Design for testability
transition delay testing
transitional delay test coverage

ASJC Scopus subject areas

Software
Computer Graphics and Computer-Aided Design
Electrical and Electronic Engineering

Access to Document

10.1109/TCAD.2010.2047475

Cite this

@article{0da265390a034b0299dd62f111e1a48e,

title = "Improved launch for higher TDF coverage with fewer test patterns",

abstract = "Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.",

keywords = "Design for testability, transition delay testing, transitional delay test coverage",

author = "Youhua Shi and Nozomu Togawa and Masao Yanagisawa and Tatsuo Ohtsuki",

year = "2010",

month = aug,

day = "1",

doi = "10.1109/TCAD.2010.2047475",

language = "English",

volume = "29",

pages = "1294--1299",

journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",

issn = "0278-0070",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "8",

}

TY - JOUR

T1 - Improved launch for higher TDF coverage with fewer test patterns

AU - Shi, Youhua

AU - Togawa, Nozomu

AU - Yanagisawa, Masao

AU - Ohtsuki, Tatsuo

PY - 2010/8/1

Y1 - 2010/8/1

N2 - Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.

AB - Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.

KW - Design for testability

KW - transition delay testing

KW - transitional delay test coverage

UR - http://www.scopus.com/inward/record.url?scp=77954873052&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77954873052&partnerID=8YFLogxK

U2 - 10.1109/TCAD.2010.2047475

DO - 10.1109/TCAD.2010.2047475

M3 - Article

AN - SCOPUS:77954873052

VL - 29

SP - 1294

EP - 1299

JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

SN - 0278-0070

IS - 8

M1 - 5512687

ER -

Improved launch for higher TDF coverage with fewer test patterns

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this