Improved launch for higher TDF coverage with fewer test patterns

    Research output: Contribution to journalArticle

    Abstract

    Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.

    Original languageEnglish
    Article number5512687
    Pages (from-to)1294-1299
    Number of pages6
    JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
    Volume29
    Issue number8
    DOIs
    Publication statusPublished - 2010 Aug

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    Networks (circuits)

    Keywords

    • Design for testability
    • transition delay testing
    • transitional delay test coverage

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Computer Graphics and Computer-Aided Design
    • Software

    Cite this

    Improved launch for higher TDF coverage with fewer test patterns. / Shi, Youhua; Togawa, Nozomu; Yanagisawa, Masao; Ohtsuki, Tatsuo.

    In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 29, No. 8, 5512687, 08.2010, p. 1294-1299.

    Research output: Contribution to journalArticle

    @article{0da265390a034b0299dd62f111e1a48e,
    title = "Improved launch for higher TDF coverage with fewer test patterns",
    abstract = "Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.",
    keywords = "Design for testability, transition delay testing, transitional delay test coverage",
    author = "Youhua Shi and Nozomu Togawa and Masao Yanagisawa and Tatsuo Ohtsuki",
    year = "2010",
    month = "8",
    doi = "10.1109/TCAD.2010.2047475",
    language = "English",
    volume = "29",
    pages = "1294--1299",
    journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
    issn = "0278-0070",
    publisher = "Institute of Electrical and Electronics Engineers Inc.",
    number = "8",

    }

    TY - JOUR

    T1 - Improved launch for higher TDF coverage with fewer test patterns

    AU - Shi, Youhua

    AU - Togawa, Nozomu

    AU - Yanagisawa, Masao

    AU - Ohtsuki, Tatsuo

    PY - 2010/8

    Y1 - 2010/8

    N2 - Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.

    AB - Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.

    KW - Design for testability

    KW - transition delay testing

    KW - transitional delay test coverage

    UR - http://www.scopus.com/inward/record.url?scp=77954873052&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=77954873052&partnerID=8YFLogxK

    U2 - 10.1109/TCAD.2010.2047475

    DO - 10.1109/TCAD.2010.2047475

    M3 - Article

    VL - 29

    SP - 1294

    EP - 1299

    JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

    JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

    SN - 0278-0070

    IS - 8

    M1 - 5512687

    ER -