Improved launch for higher TDF coverage with fewer test patterns

Youhua Shi; Nozomu Togawa; Masao Yanagisawa; Tatsuo Ohtsuki

doi:10.1109/TCAD.2010.2047475

Improved launch for higher TDF coverage with fewer test patterns

Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

Research output: Contribution to journal › Article

Abstract

Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.

Original language	English
Article number	5512687
Pages (from-to)	1294-1299
Number of pages	6
Journal	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume	29
Issue number	8
DOIs	https://doi.org/10.1109/TCAD.2010.2047475
Publication status	Published - 2010 Aug

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Keywords

Design for testability
transition delay testing
transitional delay test coverage

ASJC Scopus subject areas

Electrical and Electronic Engineering
Computer Graphics and Computer-Aided Design
Software

Cite this

Shi, Y., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2010). Improved launch for higher TDF coverage with fewer test patterns. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 29(8), 1294-1299. [5512687]. https://doi.org/10.1109/TCAD.2010.2047475

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10.1109/TCAD.2010.2047475