Improved launch for higher TDF coverage with fewer test patterns

    Research output: Contribution to journalArticle

    Abstract

    Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.

    Original languageEnglish
    Article number5512687
    Pages (from-to)1294-1299
    Number of pages6
    JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
    Volume29
    Issue number8
    DOIs
    Publication statusPublished - 2010 Aug

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    Keywords

    • Design for testability
    • transition delay testing
    • transitional delay test coverage

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Computer Graphics and Computer-Aided Design
    • Software

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