Improved method for evaluation of dielectric breakdown strength of epoxy / silica nanocomposite thin films

Yusuke Kida*, Rina Sankawa, Kohei Takahashi, Shuhei Yamamoto, Takanobu Watanabe, Kotaro Mura, Yoshihiro Ohgashi, Tetsuo Yoshimitsu, Takahiro Imai

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Engineering & Materials Science

Chemical Compounds