In situ electron yield detection of X-ray absorption fine structure of electrodes continuously emersed from electrolyte solutions

Ionel C. Stefan, Daniel Alberto Scherson

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A method is described herein for the acquisition of in situ electron yield X-ray absorption fine structure (XAFS) data of solid electrodes continuously emersed from electrolyte solutions. The success of this measurement technique relies on two key features: (i) the use of a curtain-type He jet emerging from a torch blower impinging directly on the surface of the emersed electrode to decrease the thickness of the electrolyte dragged by the electrode and eliminate droplets adhered to the surface; and (ii) careful synchronization of the rates of rotation and data acquisition to average distortions derived from wobbling and surface imperfections. The capabilities of this novel strategy were illustrated using a Zn electrode continuously emersed from an alkaline solution as a model system. As is evident from the results obtained, passivation of the Zn electrode led to a shift in the Zn K-edge absorption energy toward higher values compared to metallic Zn, as would be expected for an oxidized surface. Subsequent polarization of the electrode at potentials negative enough to reduce the passive film yielded a Zn K-edge XAFS virtually identical to that observed for a conventional Zn foil recorded in the transmission mode.

Original languageEnglish
Pages (from-to)361-366
Number of pages6
JournalJournal of Electroanalytical Chemistry
Volume554-555
Issue number1
DOIs
Publication statusPublished - 2003 Sep 15
Externally publishedYes

Fingerprint

X ray absorption
Electrolytes
Electrodes
Electrons
Blowers
Passivation
Metal foil
Data acquisition
Synchronization
Polarization
Defects

Keywords

  • Electron yield
  • Emersed electrodes
  • In situ methods
  • X-ray absorption fine structure

ASJC Scopus subject areas

  • Analytical Chemistry
  • Chemical Engineering(all)
  • Electrochemistry

Cite this

In situ electron yield detection of X-ray absorption fine structure of electrodes continuously emersed from electrolyte solutions. / Stefan, Ionel C.; Scherson, Daniel Alberto.

In: Journal of Electroanalytical Chemistry, Vol. 554-555, No. 1, 15.09.2003, p. 361-366.

Research output: Contribution to journalArticle

@article{128feab3bf0c446482a1e04f874c6ec6,
title = "In situ electron yield detection of X-ray absorption fine structure of electrodes continuously emersed from electrolyte solutions",
abstract = "A method is described herein for the acquisition of in situ electron yield X-ray absorption fine structure (XAFS) data of solid electrodes continuously emersed from electrolyte solutions. The success of this measurement technique relies on two key features: (i) the use of a curtain-type He jet emerging from a torch blower impinging directly on the surface of the emersed electrode to decrease the thickness of the electrolyte dragged by the electrode and eliminate droplets adhered to the surface; and (ii) careful synchronization of the rates of rotation and data acquisition to average distortions derived from wobbling and surface imperfections. The capabilities of this novel strategy were illustrated using a Zn electrode continuously emersed from an alkaline solution as a model system. As is evident from the results obtained, passivation of the Zn electrode led to a shift in the Zn K-edge absorption energy toward higher values compared to metallic Zn, as would be expected for an oxidized surface. Subsequent polarization of the electrode at potentials negative enough to reduce the passive film yielded a Zn K-edge XAFS virtually identical to that observed for a conventional Zn foil recorded in the transmission mode.",
keywords = "Electron yield, Emersed electrodes, In situ methods, X-ray absorption fine structure",
author = "Stefan, {Ionel C.} and Scherson, {Daniel Alberto}",
year = "2003",
month = "9",
day = "15",
doi = "10.1016/S0022-0728(03)00260-2",
language = "English",
volume = "554-555",
pages = "361--366",
journal = "Journal of Electroanalytical Chemistry",
issn = "0022-0728",
publisher = "Elsevier Sequoia",
number = "1",

}

TY - JOUR

T1 - In situ electron yield detection of X-ray absorption fine structure of electrodes continuously emersed from electrolyte solutions

AU - Stefan, Ionel C.

AU - Scherson, Daniel Alberto

PY - 2003/9/15

Y1 - 2003/9/15

N2 - A method is described herein for the acquisition of in situ electron yield X-ray absorption fine structure (XAFS) data of solid electrodes continuously emersed from electrolyte solutions. The success of this measurement technique relies on two key features: (i) the use of a curtain-type He jet emerging from a torch blower impinging directly on the surface of the emersed electrode to decrease the thickness of the electrolyte dragged by the electrode and eliminate droplets adhered to the surface; and (ii) careful synchronization of the rates of rotation and data acquisition to average distortions derived from wobbling and surface imperfections. The capabilities of this novel strategy were illustrated using a Zn electrode continuously emersed from an alkaline solution as a model system. As is evident from the results obtained, passivation of the Zn electrode led to a shift in the Zn K-edge absorption energy toward higher values compared to metallic Zn, as would be expected for an oxidized surface. Subsequent polarization of the electrode at potentials negative enough to reduce the passive film yielded a Zn K-edge XAFS virtually identical to that observed for a conventional Zn foil recorded in the transmission mode.

AB - A method is described herein for the acquisition of in situ electron yield X-ray absorption fine structure (XAFS) data of solid electrodes continuously emersed from electrolyte solutions. The success of this measurement technique relies on two key features: (i) the use of a curtain-type He jet emerging from a torch blower impinging directly on the surface of the emersed electrode to decrease the thickness of the electrolyte dragged by the electrode and eliminate droplets adhered to the surface; and (ii) careful synchronization of the rates of rotation and data acquisition to average distortions derived from wobbling and surface imperfections. The capabilities of this novel strategy were illustrated using a Zn electrode continuously emersed from an alkaline solution as a model system. As is evident from the results obtained, passivation of the Zn electrode led to a shift in the Zn K-edge absorption energy toward higher values compared to metallic Zn, as would be expected for an oxidized surface. Subsequent polarization of the electrode at potentials negative enough to reduce the passive film yielded a Zn K-edge XAFS virtually identical to that observed for a conventional Zn foil recorded in the transmission mode.

KW - Electron yield

KW - Emersed electrodes

KW - In situ methods

KW - X-ray absorption fine structure

UR - http://www.scopus.com/inward/record.url?scp=0141859908&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0141859908&partnerID=8YFLogxK

U2 - 10.1016/S0022-0728(03)00260-2

DO - 10.1016/S0022-0728(03)00260-2

M3 - Article

AN - SCOPUS:0141859908

VL - 554-555

SP - 361

EP - 366

JO - Journal of Electroanalytical Chemistry

JF - Journal of Electroanalytical Chemistry

SN - 0022-0728

IS - 1

ER -