In situ Ru K-edge X-ray absorption spectroscopy of a high-area ruthenium dioxide electrode in a Nafion-based supercapacitor environment

Yibo Mo, In Tae Bae, S. Sarangapani, Daniel Alberto Scherson

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Changes in the state of charge of a high-area RuOx electrode in an operating RuOx|Nafion|IrOx supercapacitor were monitored in situ by time-resolved, transmission Ru K-edge X-ray absorption spectroscopy (XAS). Linear and reversible variations in the intensity of the transmitted X-ray beam as a function of time were found by fixing the energy of the incident X-ray beam, Ei, at judiciously selected values within the Ru K-edge X-ray near edge structure (XANES), while the supercapacitor was charged and discharged at constant current. The sign of the slope of these temporal signals was found to vary, depending on the value of Ei. This behavior could be rationalized based on the spectral differences between the Ru K-edge XANES of RuOx in the fully oxidized and fully reduced states, recorded in situ from films of the material electrodeposited on a gold substrate in the fluorescence mode.

Original languageEnglish
Pages (from-to)572-575
Number of pages4
JournalJournal of Solid State Electrochemistry
Volume7
Issue number9
DOIs
Publication statusPublished - 2003 Sep 1
Externally publishedYes

Fingerprint

X ray absorption spectroscopy
electrochemical capacitors
Ruthenium
dioxides
ruthenium
absorption spectroscopy
X rays
Electrodes
electrodes
x rays
Gold
fixing
Fluorescence
Supercapacitor
perfluorosulfonic acid
ruthenium dioxide
gold
slopes
Substrates
fluorescence

Keywords

  • Ruthenium dioxide
  • Supercapacitor
  • X-ray absorption spectroscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Electrochemistry
  • Electrical and Electronic Engineering

Cite this

In situ Ru K-edge X-ray absorption spectroscopy of a high-area ruthenium dioxide electrode in a Nafion-based supercapacitor environment. / Mo, Yibo; Bae, In Tae; Sarangapani, S.; Scherson, Daniel Alberto.

In: Journal of Solid State Electrochemistry, Vol. 7, No. 9, 01.09.2003, p. 572-575.

Research output: Contribution to journalArticle

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