In situ Ru LII and LIII edge x-ray absorption near edge structure of electrodeposited ruthenium dioxide films

Ionel C. Stefan, Yibo Mo, Mark R. Antonio, Daniel Alberto Scherson

Research output: Contribution to journalArticle

17 Citations (Scopus)


The electronic properties of electrodeposited Ru oxide films supported on Au have been examined in situ by Ru LIII and LII edge X-ray absorption near edge structure (XANES) in acid media. The results obtained are consistent with the main voltammetric peak centered at 0.7 V vs RHE as being attributed to a redox couple involving formally Ru3+ and Ru4+ sites in the lattice. A linear correlation was found between the extent of oxidation of the film as derived from a deconvolution of the spectral features and the charge as determined from coulometric analysis of the voltammetric curves. This observation suggests that only two Ru-based redox states are involved in this electrochemical process.

Original languageEnglish
Pages (from-to)12373-12375
Number of pages3
JournalJournal of Physical Chemistry B
Issue number48
Publication statusPublished - 2002 Dec 5
Externally publishedYes


ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this