In situ scanning electron microscopy of graphene nucleation during segregation of carbon on polycrystalline Ni substrate

Yuta Momiuchi, Kazuki Yamada, Hiroki Kato, Yoshikazu Homma, Hiroki Hibino, Genki Odahara, Chuhei Oshima

    Research output: Contribution to journalArticle

    8 Citations (Scopus)

    Abstract

    In situ scanning electron microscopy (SEM) was used for observing the nucleation of graphene by segregation of bulk-dissolved carbon on a flat polycrystalline nickel surface. Preferential nucleation sites were determined on large (111) grains. In combination with ex situ atomic force microscopy measurements at the same area as with SEM, the nucleation sites were found to have step-bunched structures. Possible nucleation mechanisms are discussed based on the difference in the carbon concentration and critical nucleus size between the (111) terrace and step bunches.

    Original languageEnglish
    Article number455301
    JournalJournal of Physics D: Applied Physics
    Volume47
    Issue number45
    DOIs
    Publication statusPublished - 2014 Nov 12

    Keywords

    • Graphene
    • In situ observation
    • Nickel
    • Scanning electron microscopy
    • Segregation

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Electronic, Optical and Magnetic Materials
    • Acoustics and Ultrasonics
    • Surfaces, Coatings and Films

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