In Situ Scanning Tunneling Microscopy Observation of Electroless-Deposited NiP Film

Takayuki Homma, Takuya Yamazaki, Toshimoto Kubota, Tetsuya Osaka

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Preliminary results of an in situ scanning tunneling microscopy (STM) observation of electroless-deposited NiP film as well as that of electrodeposited film were demonstrated. The electroless-deposited film is observed to develop rough features consisting of small grains, suggesting the successive nucleation of the grains and their three-dimensional growth. The electro-deposited film, in contrast, consists of larger grains with smooth features.

Original languageEnglish
Pages (from-to)L2114-L2117
JournalJapanese Journal of Applied Physics
Volume29
Issue number11
DOIs
Publication statusPublished - 1990

Fingerprint

Scanning tunneling microscopy
scanning tunneling microscopy
Nucleation
nucleation

Keywords

  • Electroless-plating
  • In situ observation
  • Initial deposition process
  • Scanning tunneling microscopy

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

In Situ Scanning Tunneling Microscopy Observation of Electroless-Deposited NiP Film. / Homma, Takayuki; Yamazaki, Takuya; Kubota, Toshimoto; Osaka, Tetsuya.

In: Japanese Journal of Applied Physics, Vol. 29, No. 11, 1990, p. L2114-L2117.

Research output: Contribution to journalArticle

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