In Situ Scanning Tunneling Microscopy Observation of Electroless-Deposited NiP Film

Takayuki Homma, Takuya Yamazaki, Toshimoto Kubota, Tetsuya Osaka

Research output: Contribution to journalArticle

6 Citations (Scopus)


Preliminary results of an in situ scanning tunneling microscopy (STM) observation of electroless-deposited NiP film as well as that of electrodeposited film were demonstrated. The electroless-deposited film is observed to develop rough features consisting of small grains, suggesting the successive nucleation of the grains and their three-dimensional growth. The electro-deposited film, in contrast, consists of larger grains with smooth features.

Original languageEnglish
Pages (from-to)L2114-L2117
JournalJapanese journal of applied physics
Issue number11
Publication statusPublished - 1990 Nov



  • Electroless-plating
  • In situ observation
  • Initial deposition process
  • Scanning tunneling microscopy

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this