In situ space charge measurement of PCB insulations during the ageing test

K. Fukunaga, H. Tanaka, Y. Ohki, K. Okamoto, T. Maeno

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Influence of water absorption on internal space charge behaviour of an aramid/epoxy composite was firstly discussed based on the experiments using specimens after water absorption pre-treatment. More hetero charges were observed in the specimen treated at higher temperature. Chemical analyses suggested that the increase of hetero charges was due to the increase of ion impurities. Since insulating materials for printed circuit boards are generally tested at high temperature and high humidity, we have developed an in-situ space charge measurement system in an environmental chamber using the pulsed electroacoustic method. Hetero charges observed in the aramid/epoxy resin increased significantly at 40°C and 90 % RH. This insitu space charge measurement should contribute to understand the ionic migration phenomena as well as to evaluate the test conditions of printed circuit boards.

Original languageEnglish
Title of host publication2005 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP '05
Pages585-588
Number of pages4
DOIs
Publication statusPublished - 2005 Dec 1
Event2005 Conference on Electrical Insulation and Dielectric Phenomena, CEIDP '05 - Nashville, TN, United States
Duration: 2005 Oct 162005 Oct 19

Publication series

NameAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Volume2005
ISSN (Print)0084-9162

Conference

Conference2005 Conference on Electrical Insulation and Dielectric Phenomena, CEIDP '05
CountryUnited States
CityNashville, TN
Period05/10/1605/10/19

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'In situ space charge measurement of PCB insulations during the ageing test'. Together they form a unique fingerprint.

  • Cite this

    Fukunaga, K., Tanaka, H., Ohki, Y., Okamoto, K., & Maeno, T. (2005). In situ space charge measurement of PCB insulations during the ageing test. In 2005 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP '05 (pp. 585-588). [1560750] (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP; Vol. 2005). https://doi.org/10.1109/CEIDP.2005.1560750