Influence of atmosphere on photo-assisted atomic switch operations

Takami Hino, Tsuyoshi Hasegawa, Hirofumi Tanaka, Tohru Tsuruoka, Takuji Ogawa, Masakazu Aono

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We conducted light irradiation experiments in air to clarify influence of atmosphere on the operation of a photo-assisted atomic switch. In air, Pt-Ag2S/Ag nanogap electrodes with a PTCDI thin layer in their nanogaps showed current fluctuations with an applied bias of from 1.5 V to 6 V regardless of the bias polarity and with or without light irradiation. This is in contrast to the fact that only two things cause an increase in current that result in the formation of a silver bridge and switching behavior under vacuum, namely, light irradiation and the application of positive bias to the Ag 2S/Ag electrode [1]. In addition, photocurrent caused by irradiating a PTCDI thin layer was found to be sensitive to air and to N2. These results indicate that moisture or other gas molecules in air and in N 2 have an influence on the photo-assisted atomic switching behavior.

Original languageEnglish
Title of host publicationKey Engineering Materials
Pages116-120
Number of pages5
Volume596
DOIs
Publication statusPublished - 2014
Externally publishedYes
Event4th International Conference on Advanced Micro-Device Engineering, AMDE 2012 - Kiryu, Japan
Duration: 2012 Dec 72012 Dec 7

Publication series

NameKey Engineering Materials
Volume596
ISSN (Print)10139826

Other

Other4th International Conference on Advanced Micro-Device Engineering, AMDE 2012
CountryJapan
CityKiryu
Period12/12/712/12/7

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Keywords

  • AgS
  • Atomic switch
  • Nanogap electrode
  • Photoconductive material

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Hino, T., Hasegawa, T., Tanaka, H., Tsuruoka, T., Ogawa, T., & Aono, M. (2014). Influence of atmosphere on photo-assisted atomic switch operations. In Key Engineering Materials (Vol. 596, pp. 116-120). (Key Engineering Materials; Vol. 596). https://doi.org/10.4028/www.scientific.net/KEM.596.116