Influence of substrates on magnetic property and crystalline orientation of CoCrTa/TiCr perpendicular magnetic recording medium

Toru Asahi, M. Ikeda, A. Takizawa, T. Onoue, Tetsuya Osaka

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The influence of substrates on magnetic property and crystalline orientation of CoCrTa/TiCr perpendicular magnetic recording medium was investigated using a glass plate and a Si(100) single crystal. Magnetic measurements revealed that the film sputtered on a Si(100) substrate possessed a higher perpendicular coercive force than that on glass, where the pretreatment of the Si(100) substrate by aqueous HF solution effectively improved the magnetic properties. X-ray diffraction analysis of the films indicated that the crystallinity of the TiCr layer formed on the Si(100) substrate with the HF pretreatment was higher than that on the glass substrate. It was also found that CoCrTa and TiCr layers on the Si(100) substrate with the HF pretreatment had a narrower distribution of their c-axis orientation than those on glass substrate. The results of X-ray diffraction analysis were consistent with those of the TEM observation for cross-section bright- and dark-field images and the corresponding THEED patterns. These results suggest that the crystalline surface of the Si(100) substrate with HF pretreatment has the effect of inducing preferred orientation in the TiCr underlayer, which leads to a decrease in distribution of the c-axis orientation of Co grains in the CoCrTa layer, resulting in an increase in the perpendicular coercive force.

Original languageEnglish
Pages (from-to)293-299
Number of pages7
JournalJournal of Magnetism and Magnetic Materials
Volume212
Issue number1
DOIs
Publication statusPublished - 2000 Mar

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Magnetic recording
magnetic recording
Crystal orientation
Magnetic properties
magnetic properties
Crystalline materials
Substrates
pretreatment
Glass
glass
Coercive force
X ray diffraction analysis
Magnetic variables measurement
diffraction
magnetic measurement
crystallinity
x rays
Single crystals
Transmission electron microscopy
transmission electron microscopy

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Influence of substrates on magnetic property and crystalline orientation of CoCrTa/TiCr perpendicular magnetic recording medium. / Asahi, Toru; Ikeda, M.; Takizawa, A.; Onoue, T.; Osaka, Tetsuya.

In: Journal of Magnetism and Magnetic Materials, Vol. 212, No. 1, 03.2000, p. 293-299.

Research output: Contribution to journalArticle

@article{3fbb9e5f8d124d0ea1562edb6f739723,
title = "Influence of substrates on magnetic property and crystalline orientation of CoCrTa/TiCr perpendicular magnetic recording medium",
abstract = "The influence of substrates on magnetic property and crystalline orientation of CoCrTa/TiCr perpendicular magnetic recording medium was investigated using a glass plate and a Si(100) single crystal. Magnetic measurements revealed that the film sputtered on a Si(100) substrate possessed a higher perpendicular coercive force than that on glass, where the pretreatment of the Si(100) substrate by aqueous HF solution effectively improved the magnetic properties. X-ray diffraction analysis of the films indicated that the crystallinity of the TiCr layer formed on the Si(100) substrate with the HF pretreatment was higher than that on the glass substrate. It was also found that CoCrTa and TiCr layers on the Si(100) substrate with the HF pretreatment had a narrower distribution of their c-axis orientation than those on glass substrate. The results of X-ray diffraction analysis were consistent with those of the TEM observation for cross-section bright- and dark-field images and the corresponding THEED patterns. These results suggest that the crystalline surface of the Si(100) substrate with HF pretreatment has the effect of inducing preferred orientation in the TiCr underlayer, which leads to a decrease in distribution of the c-axis orientation of Co grains in the CoCrTa layer, resulting in an increase in the perpendicular coercive force.",
author = "Toru Asahi and M. Ikeda and A. Takizawa and T. Onoue and Tetsuya Osaka",
year = "2000",
month = "3",
doi = "10.1016/S0304-8853(99)00774-X",
language = "English",
volume = "212",
pages = "293--299",
journal = "Journal of Magnetism and Magnetic Materials",
issn = "0304-8853",
publisher = "Elsevier",
number = "1",

}

TY - JOUR

T1 - Influence of substrates on magnetic property and crystalline orientation of CoCrTa/TiCr perpendicular magnetic recording medium

AU - Asahi, Toru

AU - Ikeda, M.

AU - Takizawa, A.

AU - Onoue, T.

AU - Osaka, Tetsuya

PY - 2000/3

Y1 - 2000/3

N2 - The influence of substrates on magnetic property and crystalline orientation of CoCrTa/TiCr perpendicular magnetic recording medium was investigated using a glass plate and a Si(100) single crystal. Magnetic measurements revealed that the film sputtered on a Si(100) substrate possessed a higher perpendicular coercive force than that on glass, where the pretreatment of the Si(100) substrate by aqueous HF solution effectively improved the magnetic properties. X-ray diffraction analysis of the films indicated that the crystallinity of the TiCr layer formed on the Si(100) substrate with the HF pretreatment was higher than that on the glass substrate. It was also found that CoCrTa and TiCr layers on the Si(100) substrate with the HF pretreatment had a narrower distribution of their c-axis orientation than those on glass substrate. The results of X-ray diffraction analysis were consistent with those of the TEM observation for cross-section bright- and dark-field images and the corresponding THEED patterns. These results suggest that the crystalline surface of the Si(100) substrate with HF pretreatment has the effect of inducing preferred orientation in the TiCr underlayer, which leads to a decrease in distribution of the c-axis orientation of Co grains in the CoCrTa layer, resulting in an increase in the perpendicular coercive force.

AB - The influence of substrates on magnetic property and crystalline orientation of CoCrTa/TiCr perpendicular magnetic recording medium was investigated using a glass plate and a Si(100) single crystal. Magnetic measurements revealed that the film sputtered on a Si(100) substrate possessed a higher perpendicular coercive force than that on glass, where the pretreatment of the Si(100) substrate by aqueous HF solution effectively improved the magnetic properties. X-ray diffraction analysis of the films indicated that the crystallinity of the TiCr layer formed on the Si(100) substrate with the HF pretreatment was higher than that on the glass substrate. It was also found that CoCrTa and TiCr layers on the Si(100) substrate with the HF pretreatment had a narrower distribution of their c-axis orientation than those on glass substrate. The results of X-ray diffraction analysis were consistent with those of the TEM observation for cross-section bright- and dark-field images and the corresponding THEED patterns. These results suggest that the crystalline surface of the Si(100) substrate with HF pretreatment has the effect of inducing preferred orientation in the TiCr underlayer, which leads to a decrease in distribution of the c-axis orientation of Co grains in the CoCrTa layer, resulting in an increase in the perpendicular coercive force.

UR - http://www.scopus.com/inward/record.url?scp=0033901785&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033901785&partnerID=8YFLogxK

U2 - 10.1016/S0304-8853(99)00774-X

DO - 10.1016/S0304-8853(99)00774-X

M3 - Article

AN - SCOPUS:0033901785

VL - 212

SP - 293

EP - 299

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

SN - 0304-8853

IS - 1

ER -