Infrared and Raman spectroscopy of organic thin films used for electronic devices

Yukio Furukawa, K. Seto, K. Nakajima, Y. Itoh, J. Eguchi, T. Sugiyama, H. Fujimura

    Research output: Contribution to journalArticle

    15 Citations (Scopus)

    Abstract

    We present Raman imaging and photoexcitation infrared studies of organic semiconductor films, which are used in organic light-emitting diodes, thin-film transistors, and photovoltaic solar cells. Raman images of the ratio (R) of intensity of the 1596-cm -1 band (b 3g) to that of the 1533-cm -1 band (a g) were used for characterizing the 1.55-nm and the 1.44-nm phases in pentacene thin films. The Raman spectrum of N,N′-di-1-naphthaleyl-N,N′-diphenyl-1,1′-biphenyl-4, 4′-diamine (NPD) film formed on a MoO 3-deposited indium-tin-oxide (ITO)/glass substrate indicated that the cation of NPD is formed upon oxidation by MoO 3. The Raman image of the sample showed the heterogeneous distribution of the cation of NPD. Photoinduced infrared absorption from a film of regioregular poly(3-octylthiophene) (P3OT) and [6,6]-phenyl-C 61-butyric acid methyl ether (PCBM) blend was measured by difference infrared spectroscopy. The temperature dependence of photoinduced infrared absorption due to positive polarons showed the existence of two kinds of carrier traps.

    Original languageEnglish
    Pages (from-to)5-9
    Number of pages5
    JournalVibrational Spectroscopy
    Volume60
    DOIs
    Publication statusPublished - 2012 May

    Fingerprint

    Raman spectroscopy
    Infrared spectroscopy
    Infrared absorption
    Thin films
    Cations
    ITO glass
    Methyl Ethers
    Polarons
    Semiconducting organic compounds
    Diamines
    Butyric Acid
    Photoexcitation
    Organic light emitting diodes (OLED)
    Thin film transistors
    Raman scattering
    Solar cells
    Infrared radiation
    Imaging techniques
    Oxidation
    Substrates

    Keywords

    • Imaging
    • IR
    • Molybdenum oxide
    • NPD
    • Pentacene
    • Photoexcitation
    • Polarons
    • Raman

    ASJC Scopus subject areas

    • Spectroscopy

    Cite this

    Infrared and Raman spectroscopy of organic thin films used for electronic devices. / Furukawa, Yukio; Seto, K.; Nakajima, K.; Itoh, Y.; Eguchi, J.; Sugiyama, T.; Fujimura, H.

    In: Vibrational Spectroscopy, Vol. 60, 05.2012, p. 5-9.

    Research output: Contribution to journalArticle

    Furukawa, Yukio ; Seto, K. ; Nakajima, K. ; Itoh, Y. ; Eguchi, J. ; Sugiyama, T. ; Fujimura, H. / Infrared and Raman spectroscopy of organic thin films used for electronic devices. In: Vibrational Spectroscopy. 2012 ; Vol. 60. pp. 5-9.
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