Instrument for Creating Surface Layer Structure and for in-situ Layer Observation with Surface Electron Spectroscopic Tomography

Akira Kurokawa; Shingo Ichimura; Jae Jeong; Joseph Toth; Kazuhiro Yoshihara; Yoshio Saitoh; Yoshihiro Satoh

doi:10.3131/jvsj.38.179

Instrument for Creating Surface Layer Structure and for in-situ Layer Observation with Surface Electron Spectroscopic Tomography

Akira Kurokawa, Shingo Ichimura, Jae Jeong, Joseph Toth, Kazuhiro Yoshihara, Yoshio Saitoh, Yoshihiro Satoh

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	179-182
Number of pages	4
Journal	Shinku
Volume	38
Issue number	3
DOIs	https://doi.org/10.3131/jvsj.38.179
Publication status	Published - 1995 Jan 1
Externally published	Yes

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces, Coatings and Films
Electrical and Electronic Engineering

Cite this

Kurokawa, A., Ichimura, S., Jeong, J., Toth, J., Yoshihara, K., Saitoh, Y., & Satoh, Y. (1995). Instrument for Creating Surface Layer Structure and for in-situ Layer Observation with Surface Electron Spectroscopic Tomography. Shinku, 38(3), 179-182. https://doi.org/10.3131/jvsj.38.179

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AU - Saitoh, Yoshio

AU - Satoh, Yoshihiro

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Access to Document

10.3131/jvsj.38.179