Instrument for Creating Surface Layer Structure and for in-situ Layer Observation with Surface Electron Spectroscopic Tomography

Akira Kurokawa; Shingo Ichimura; Jae Jeong; Joseph Toth; Kazuhiro Yoshihara; Yoshio Saitoh; Yoshihiro Satoh

doi:10.3131/jvsj.38.179

Instrument for Creating Surface Layer Structure and for in-situ Layer Observation with Surface Electron Spectroscopic Tomography

Akira Kurokawa, Shingo Ichimura, Jae Jeong, Joseph Toth, Kazuhiro Yoshihara, Yoshio Saitoh, Yoshihiro Satoh

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	179-182
Number of pages	4
Journal	Shinku
Volume	38
Issue number	3
DOIs	https://doi.org/10.3131/jvsj.38.179
Publication status	Published - 1995 Jan 1
Externally published	Yes

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces, Coatings and Films
Electrical and Electronic Engineering

Access to Document

10.3131/jvsj.38.179

Cite this

Kurokawa, A., Ichimura, S., Jeong, J., Toth, J., Yoshihara, K., Saitoh, Y., & Satoh, Y. (1995). Instrument for Creating Surface Layer Structure and for in-situ Layer Observation with Surface Electron Spectroscopic Tomography. Shinku, 38(3), 179-182. https://doi.org/10.3131/jvsj.38.179

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AU - Saitoh, Yoshio

AU - Satoh, Yoshihiro

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