Interlayer exchange coupling in Co2FeAl0.5Si 0.5/Cr/Co2 FeAl0.5Si0.5 trilayers

T. Furubayashi; K. Kodama; H. S. Goripati; Y. K. Takahashi; K. Inomata; K. Hono

doi:10.1063/1.3072018

Interlayer exchange coupling in Co₂FeAl_0.5Si _0.5/Cr/Co₂ FeAl_0.5Si_0.5 trilayers

T. Furubayashi, K. Kodama, H. S. Goripati, Y. K. Takahashi, K. Inomata, K. Hono

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Interlayer exchange couplings were examined for Co2 FeAl0.5 Si0.5 (CFAS) /Cr/CFAS trilayered films grown on MgO (001) single crystal and thermally oxidized Si substrates. The films were (001) epitaxial on MgO and (110) textured polycrystalline on SiO2. Strong exchange couplings were observed for the films with the 1.5 nm thick Cr spacer layer. A 90° coupling is dominant in the (001) epitaxial film. In contrast, an antiparallel coupling exists in the polycrystalline one. The relationship of interlayer couplings with the structure is discussed.

Original language	English
Article number	07C305
Journal	Journal of Applied Physics
Volume	105
Issue number	7
DOIs	https://doi.org/10.1063/1.3072018
Publication status	Published - 2009
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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title = "Interlayer exchange coupling in Co2FeAl0.5Si 0.5/Cr/Co2 FeAl0.5Si0.5 trilayers",

abstract = "Interlayer exchange couplings were examined for Co2 FeAl0.5 Si0.5 (CFAS) /Cr/CFAS trilayered films grown on MgO (001) single crystal and thermally oxidized Si substrates. The films were (001) epitaxial on MgO and (110) textured polycrystalline on SiO2. Strong exchange couplings were observed for the films with the 1.5 nm thick Cr spacer layer. A 90° coupling is dominant in the (001) epitaxial film. In contrast, an antiparallel coupling exists in the polycrystalline one. The relationship of interlayer couplings with the structure is discussed.",

author = "T. Furubayashi and K. Kodama and Goripati, {H. S.} and Takahashi, {Y. K.} and K. Inomata and K. Hono",

note = "Funding Information: K.K. and H.S.G. thank the National Institute for Materials Science for providing a NIMS junior research assistantship. This work was partly supported by a Grant-in-Aid for Scientific Research (B) Grant No. 20360322, a Grant-in-Aid for Scientific Research in Priority Area “Creation and control of spin current” Grant No. 19048029, and the World Premier International Research Center Initiative (WPI Initiative) on Materials Nanoarchitronics, MEXT, Japan.",

year = "2009",

doi = "10.1063/1.3072018",

language = "English",

volume = "105",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

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T1 - Interlayer exchange coupling in Co2FeAl0.5Si 0.5/Cr/Co2 FeAl0.5Si0.5 trilayers

AU - Furubayashi, T.

AU - Kodama, K.

AU - Goripati, H. S.

AU - Takahashi, Y. K.

AU - Inomata, K.

AU - Hono, K.

N1 - Funding Information: K.K. and H.S.G. thank the National Institute for Materials Science for providing a NIMS junior research assistantship. This work was partly supported by a Grant-in-Aid for Scientific Research (B) Grant No. 20360322, a Grant-in-Aid for Scientific Research in Priority Area “Creation and control of spin current” Grant No. 19048029, and the World Premier International Research Center Initiative (WPI Initiative) on Materials Nanoarchitronics, MEXT, Japan.

PY - 2009

Y1 - 2009

N2 - Interlayer exchange couplings were examined for Co2 FeAl0.5 Si0.5 (CFAS) /Cr/CFAS trilayered films grown on MgO (001) single crystal and thermally oxidized Si substrates. The films were (001) epitaxial on MgO and (110) textured polycrystalline on SiO2. Strong exchange couplings were observed for the films with the 1.5 nm thick Cr spacer layer. A 90° coupling is dominant in the (001) epitaxial film. In contrast, an antiparallel coupling exists in the polycrystalline one. The relationship of interlayer couplings with the structure is discussed.

AB - Interlayer exchange couplings were examined for Co2 FeAl0.5 Si0.5 (CFAS) /Cr/CFAS trilayered films grown on MgO (001) single crystal and thermally oxidized Si substrates. The films were (001) epitaxial on MgO and (110) textured polycrystalline on SiO2. Strong exchange couplings were observed for the films with the 1.5 nm thick Cr spacer layer. A 90° coupling is dominant in the (001) epitaxial film. In contrast, an antiparallel coupling exists in the polycrystalline one. The relationship of interlayer couplings with the structure is discussed.

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Interlayer exchange coupling in Co₂FeAl_0.5Si _0.5/Cr/Co₂ FeAl_0.5Si_0.5 trilayers

Abstract

ASJC Scopus subject areas

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