TY - GEN
T1 - Interpretation of the richardson plot in time series representation
AU - Blackburn, William
AU - Segui Prieto, Miguel
AU - Schuster, Alfons Josef
PY - 2000
Y1 - 2000
N2 - In fractal analysis of a time series, the relationship between series length and ruler length may be represented graphically as a Richardson Plot. Fractal dimension measures can be estimated for particular ranges of ruler length, supported by the graphical representation. This paper discusses Richardson Plots which have been obtained for several types of time series. From these, patterns have been identified with explanations. There is particular focus on local maxima and minima. Significant influences found present are described as gradient and vertex effects. The task - and implications - of partitioning the range of ruler lengths in determining fractal dimension measures is briefly addressed.
AB - In fractal analysis of a time series, the relationship between series length and ruler length may be represented graphically as a Richardson Plot. Fractal dimension measures can be estimated for particular ranges of ruler length, supported by the graphical representation. This paper discusses Richardson Plots which have been obtained for several types of time series. From these, patterns have been identified with explanations. There is particular focus on local maxima and minima. Significant influences found present are described as gradient and vertex effects. The task - and implications - of partitioning the range of ruler lengths in determining fractal dimension measures is briefly addressed.
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M3 - Conference contribution
AN - SCOPUS:84944071052
SN - 3540414509
SN - 9783540414506
VL - 1983
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 206
EP - 211
BT - Intelligent Data Engineering and Automated Learning - IDEAL 2000: Data Mining, Financial Engineering, and Intelligent Agents - 2nd International Conference, Proceedings
PB - Springer Verlag
T2 - 2nd International Conference on Intelligent Data Engineering and Automated Learning, IDEAL 2000
Y2 - 13 December 2000 through 15 December 2000
ER -