Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zrx, Ti1-x)03 Epitaxial Films

Ryuta Noda, Takahiro Shimidzu, Kiyotaka Wasa, Takahiko Yanagitani

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Pb(Zrx, Ti1-x)03 (PZT)ceramics display the morphotropic phase boundary (MPB)around x=0.53. In general, PZT ceramics show the anomalously high piezoelectricity and dielectric constant near the MPB. However, PbTiO3 sputter-epitaxial films at x=0 showed higher kt2 than PZT near the MPB in our previous studies, with good reproducibility. In this study, in order to demonstrate that PZT sputter-epitaxial films do not display MPB (phase transition), we measured lattice constant, kt2, dielectric constant and coercive field as a function of x (Zr concentration). As a result, the phase transition was not observed in PZT sputter-epitaxial films. Such phenomena observed in sputter-epitaxial films may be attributed to the damage due to the negative oxygen ion bombardment on the films.

    Original languageEnglish
    Title of host publication2018 IEEE International Ultrasonics Symposium, IUS 2018
    PublisherIEEE Computer Society
    Volume2018-October
    ISBN (Electronic)9781538634257
    DOIs
    Publication statusPublished - 2018 Dec 17
    Event2018 IEEE International Ultrasonics Symposium, IUS 2018 - Kobe, Japan
    Duration: 2018 Oct 222018 Oct 25

    Other

    Other2018 IEEE International Ultrasonics Symposium, IUS 2018
    CountryJapan
    CityKobe
    Period18/10/2218/10/25

    Fingerprint

    ceramics
    permittivity
    piezoelectricity
    oxygen ions
    negative ions
    bombardment
    damage

    Keywords

    • Epitaxial film
    • MPB
    • PZT
    • Sputtering

    ASJC Scopus subject areas

    • Acoustics and Ultrasonics

    Cite this

    Noda, R., Shimidzu, T., Wasa, K., & Yanagitani, T. (2018). Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zrx, Ti1-x)03 Epitaxial Films. In 2018 IEEE International Ultrasonics Symposium, IUS 2018 (Vol. 2018-October). [8580154] IEEE Computer Society. https://doi.org/10.1109/ULTSYM.2018.8580154

    Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zrx, Ti1-x)03 Epitaxial Films. / Noda, Ryuta; Shimidzu, Takahiro; Wasa, Kiyotaka; Yanagitani, Takahiko.

    2018 IEEE International Ultrasonics Symposium, IUS 2018. Vol. 2018-October IEEE Computer Society, 2018. 8580154.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Noda, R, Shimidzu, T, Wasa, K & Yanagitani, T 2018, Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zrx, Ti1-x)03 Epitaxial Films. in 2018 IEEE International Ultrasonics Symposium, IUS 2018. vol. 2018-October, 8580154, IEEE Computer Society, 2018 IEEE International Ultrasonics Symposium, IUS 2018, Kobe, Japan, 18/10/22. https://doi.org/10.1109/ULTSYM.2018.8580154
    Noda R, Shimidzu T, Wasa K, Yanagitani T. Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zrx, Ti1-x)03 Epitaxial Films. In 2018 IEEE International Ultrasonics Symposium, IUS 2018. Vol. 2018-October. IEEE Computer Society. 2018. 8580154 https://doi.org/10.1109/ULTSYM.2018.8580154
    Noda, Ryuta ; Shimidzu, Takahiro ; Wasa, Kiyotaka ; Yanagitani, Takahiko. / Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zrx, Ti1-x)03 Epitaxial Films. 2018 IEEE International Ultrasonics Symposium, IUS 2018. Vol. 2018-October IEEE Computer Society, 2018.
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