Ion-beam-induced recrystallization in Si(100) studied with slow positron annihilation and rutherford backscattering and channeling

N. Hayashi, R. Suzuki, M. Hasegawa, Naoto Kobayashi, S. Tanigawa, T. Mikado

Research output: Contribution to journalArticle

23 Citations (Scopus)

Fingerprint Dive into the research topics of 'Ion-beam-induced recrystallization in Si(100) studied with slow positron annihilation and rutherford backscattering and channeling'. Together they form a unique fingerprint.

Physics & Astronomy