Ionic/electronic mixed conductor tip of a scanning tunneling microscope as a metal atom source for nanostructuring

K. Terabe, T. Nakayama, Tsuyoshi Hasegawa, M. Aono

Research output: Contribution to journalArticle

42 Citations (Scopus)

Abstract

Silver sulfide (Ag2S) which has Ag-ionic/electronic mixed conductivity is used for fabricating a tip used for a scanning tunneling microscope. The mixed conductor tip is capable of nanostructuring by depositing Ag atoms continuously on a sample as well as imaging the surface structure. To obtain the surface image, a nanoscale Ag protrusion is formed at an apex of the tip using a local solid electrochemical reaction, working as "a mini-tip." We fabricate a nanoscale line structure on the sample by scanning the Ag2S tip with the protrusion under appropriate bias voltages and tunneling currents. The structuring is thought to be made up of two layers of Ag atoms deposited from the protrusion.

Original languageEnglish
Pages (from-to)4009-4011
Number of pages3
JournalApplied Physics Letters
Volume80
Issue number21
DOIs
Publication statusPublished - 2002 May 27
Externally publishedYes

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conductors
microscopes
scanning
electronics
metals
atoms
sulfides
apexes
silver
conductivity
electric potential

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Ionic/electronic mixed conductor tip of a scanning tunneling microscope as a metal atom source for nanostructuring. / Terabe, K.; Nakayama, T.; Hasegawa, Tsuyoshi; Aono, M.

In: Applied Physics Letters, Vol. 80, No. 21, 27.05.2002, p. 4009-4011.

Research output: Contribution to journalArticle

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