Just-on-surface magnetic force microscopy

Sumio Hosaka, Atsushi Kikukawa, Yukio Honda, Tsuyoshi Hasegawa

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

We propose a just-on-surface magnetic force microscope (JS-MFM) for advanced spatial resolution of magnetic stray field image. In this letter, we describe that the JS-MFM provides better resolution of the stray field image than that in conventional magnetic force microscope, theoretically and experimentally. In the rough estimations, magnetic stray field image just on the surface provides higher resolution of less than 10 nm. In the experiments, initial results demonstrate that JS-MFM can observe a localized surface magnetic stray field caused by small magnetizations in the perpendicularly recorded magnetic domains with a high resolution of around 10 nm.

Original languageEnglish
Pages (from-to)3407-3409
Number of pages3
JournalApplied Physics Letters
Volume65
Issue number26
DOIs
Publication statusPublished - 1994
Externally publishedYes

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magnetic force microscopy
microscopes
magnetic fields
high resolution
magnetic domains
spatial resolution
magnetization

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Just-on-surface magnetic force microscopy. / Hosaka, Sumio; Kikukawa, Atsushi; Honda, Yukio; Hasegawa, Tsuyoshi.

In: Applied Physics Letters, Vol. 65, No. 26, 1994, p. 3407-3409.

Research output: Contribution to journalArticle

Hosaka, S, Kikukawa, A, Honda, Y & Hasegawa, T 1994, 'Just-on-surface magnetic force microscopy', Applied Physics Letters, vol. 65, no. 26, pp. 3407-3409. https://doi.org/10.1063/1.112987
Hosaka, Sumio ; Kikukawa, Atsushi ; Honda, Yukio ; Hasegawa, Tsuyoshi. / Just-on-surface magnetic force microscopy. In: Applied Physics Letters. 1994 ; Vol. 65, No. 26. pp. 3407-3409.
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