Laser scanning microscope with a differential heterodyne optical probe

Shinichi Komatsu, Hiroyuki Suhara, Hitoshi Ohzu

    Research output: Contribution to journalArticle

    8 Citations (Scopus)

    Abstract

    A new laser scanning microscope system has been developed to observe the spatial distribution of light scattering particles or defects in a partially transparent object. The present microscope has an optical probe whose intensity is modulated by the interference effect between two crossed laser beams with slightly different frequencies. In this paper, a Zeeman laser combined with a simple polarizing optical system is used to produce two such coherent beams. Experimental results obtained by using a latex sphere and a microscale as the target show qualitatively that high image contrast is obtained by the present method even if some obscuring particles exist in front of the probe volume. Distributions of light scattering particles or defects in a LiNbO3 and TGS single crystal can be visualized by a computer-controlled scan stage.

    Original languageEnglish
    Pages (from-to)4244-4249
    Number of pages6
    JournalApplied Optics
    Volume29
    Issue number28
    DOIs
    Publication statusPublished - 1990

    Fingerprint

    Light scattering
    Microscopes
    microscopes
    Scanning
    Defects
    scanning
    Lasers
    probes
    light scattering
    Latexes
    Optical systems
    Spatial distribution
    lasers
    Laser beams
    defects
    Single crystals
    image contrast
    latex
    microbalances
    spatial distribution

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics

    Cite this

    Laser scanning microscope with a differential heterodyne optical probe. / Komatsu, Shinichi; Suhara, Hiroyuki; Ohzu, Hitoshi.

    In: Applied Optics, Vol. 29, No. 28, 1990, p. 4244-4249.

    Research output: Contribution to journalArticle

    Komatsu, Shinichi ; Suhara, Hiroyuki ; Ohzu, Hitoshi. / Laser scanning microscope with a differential heterodyne optical probe. In: Applied Optics. 1990 ; Vol. 29, No. 28. pp. 4244-4249.
    @article{ce9437c8aa9f486ba322c0d3d158c190,
    title = "Laser scanning microscope with a differential heterodyne optical probe",
    abstract = "A new laser scanning microscope system has been developed to observe the spatial distribution of light scattering particles or defects in a partially transparent object. The present microscope has an optical probe whose intensity is modulated by the interference effect between two crossed laser beams with slightly different frequencies. In this paper, a Zeeman laser combined with a simple polarizing optical system is used to produce two such coherent beams. Experimental results obtained by using a latex sphere and a microscale as the target show qualitatively that high image contrast is obtained by the present method even if some obscuring particles exist in front of the probe volume. Distributions of light scattering particles or defects in a LiNbO3 and TGS single crystal can be visualized by a computer-controlled scan stage.",
    author = "Shinichi Komatsu and Hiroyuki Suhara and Hitoshi Ohzu",
    year = "1990",
    doi = "10.1364/AO.29.004244",
    language = "English",
    volume = "29",
    pages = "4244--4249",
    journal = "Applied Optics",
    issn = "1559-128X",
    publisher = "The Optical Society",
    number = "28",

    }

    TY - JOUR

    T1 - Laser scanning microscope with a differential heterodyne optical probe

    AU - Komatsu, Shinichi

    AU - Suhara, Hiroyuki

    AU - Ohzu, Hitoshi

    PY - 1990

    Y1 - 1990

    N2 - A new laser scanning microscope system has been developed to observe the spatial distribution of light scattering particles or defects in a partially transparent object. The present microscope has an optical probe whose intensity is modulated by the interference effect between two crossed laser beams with slightly different frequencies. In this paper, a Zeeman laser combined with a simple polarizing optical system is used to produce two such coherent beams. Experimental results obtained by using a latex sphere and a microscale as the target show qualitatively that high image contrast is obtained by the present method even if some obscuring particles exist in front of the probe volume. Distributions of light scattering particles or defects in a LiNbO3 and TGS single crystal can be visualized by a computer-controlled scan stage.

    AB - A new laser scanning microscope system has been developed to observe the spatial distribution of light scattering particles or defects in a partially transparent object. The present microscope has an optical probe whose intensity is modulated by the interference effect between two crossed laser beams with slightly different frequencies. In this paper, a Zeeman laser combined with a simple polarizing optical system is used to produce two such coherent beams. Experimental results obtained by using a latex sphere and a microscale as the target show qualitatively that high image contrast is obtained by the present method even if some obscuring particles exist in front of the probe volume. Distributions of light scattering particles or defects in a LiNbO3 and TGS single crystal can be visualized by a computer-controlled scan stage.

    UR - http://www.scopus.com/inward/record.url?scp=8244247995&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=8244247995&partnerID=8YFLogxK

    U2 - 10.1364/AO.29.004244

    DO - 10.1364/AO.29.004244

    M3 - Article

    VL - 29

    SP - 4244

    EP - 4249

    JO - Applied Optics

    JF - Applied Optics

    SN - 1559-128X

    IS - 28

    ER -