Liquid Metal as Electrical Interface Material with Temporal Stability and Stretch Tolerance

Takashi Sato; Kento Yamagishi; Michinao Hashimoto; Eiji Iwase

doi:10.1109/MEMS51782.2021.9375307

Liquid Metal as Electrical Interface Material with Temporal Stability and Stretch Tolerance

Takashi Sato, Kento Yamagishi, Michinao Hashimoto, Eiji Iwase

School of Fundamental Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Electrical interface material (EIM) is an important component to develop stretchable electronics. Currently available EIMs suffer from the trade-off between low value and stretch tolerance of contact resistance. To overcome this challenge, we demonstrated the use of liquid metal (LM) as an EIM between solid metal (SM) pads for stretchable electronic devices. With LM, we achieved low contact resistance with temporal stability and stretch tolerance. Our study suggested that the contact resistance between an LM and an SM decreases over time due to alloying, and the contact resistance was reduced to 18.6% in 103 days by ensuring the electrical connection under vacuum during the fabrication. Furthermore, the use of the LM as an EIM enabled maintaining the change in contact resistance below 9% during 100% stretching deformation repeated 100 times. These results suggest that LM can be used as an EIM with temporal stability and stretch tolerance.

Original language	English
Title of host publication	34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	689-692
Number of pages	4
ISBN (Electronic)	9781665419123
DOIs	https://doi.org/10.1109/MEMS51782.2021.9375307
Publication status	Published - 2021 Jan 25
Event	34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021 - Virtual, Gainesville, United States Duration: 2021 Jan 25 → 2021 Jan 29

Publication series

Name	Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
Volume	2021-January
ISSN (Print)	1084-6999

Conference

Conference	34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021
Country/Territory	United States
City	Virtual, Gainesville
Period	21/1/25 → 21/1/29

Keywords

Stretchable electronics
contact resistance
galinstan
liquid metals
stretch tolerance
temporal stability

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Mechanical Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/MEMS51782.2021.9375307

Cite this

Sato, T., Yamagishi, K., Hashimoto, M., & Iwase, E. (2021). Liquid Metal as Electrical Interface Material with Temporal Stability and Stretch Tolerance. In 34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021 (pp. 689-692). [9375307] (Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS); Vol. 2021-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MEMS51782.2021.9375307

Liquid Metal as Electrical Interface Material with Temporal Stability and Stretch Tolerance. / Sato, Takashi; Yamagishi, Kento; Hashimoto, Michinao et al.

34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021. Institute of Electrical and Electronics Engineers Inc., 2021. p. 689-692 9375307 (Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS); Vol. 2021-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Sato, T, Yamagishi, K, Hashimoto, M & Iwase, E 2021, Liquid Metal as Electrical Interface Material with Temporal Stability and Stretch Tolerance. in 34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021., 9375307, Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS), vol. 2021-January, Institute of Electrical and Electronics Engineers Inc., pp. 689-692, 34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021, Virtual, Gainesville, United States, 21/1/25. https://doi.org/10.1109/MEMS51782.2021.9375307

Sato T, Yamagishi K, Hashimoto M, Iwase E. Liquid Metal as Electrical Interface Material with Temporal Stability and Stretch Tolerance. In 34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021. Institute of Electrical and Electronics Engineers Inc. 2021. p. 689-692. 9375307. (Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)). doi: 10.1109/MEMS51782.2021.9375307

Sato, Takashi ; Yamagishi, Kento ; Hashimoto, Michinao et al. / Liquid Metal as Electrical Interface Material with Temporal Stability and Stretch Tolerance. 34th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2021. Institute of Electrical and Electronics Engineers Inc., 2021. pp. 689-692 (Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)).

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abstract = "Electrical interface material (EIM) is an important component to develop stretchable electronics. Currently available EIMs suffer from the trade-off between low value and stretch tolerance of contact resistance. To overcome this challenge, we demonstrated the use of liquid metal (LM) as an EIM between solid metal (SM) pads for stretchable electronic devices. With LM, we achieved low contact resistance with temporal stability and stretch tolerance. Our study suggested that the contact resistance between an LM and an SM decreases over time due to alloying, and the contact resistance was reduced to 18.6% in 103 days by ensuring the electrical connection under vacuum during the fabrication. Furthermore, the use of the LM as an EIM enabled maintaining the change in contact resistance below 9% during 100% stretching deformation repeated 100 times. These results suggest that LM can be used as an EIM with temporal stability and stretch tolerance.",

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author = "Takashi Sato and Kento Yamagishi and Michinao Hashimoto and Eiji Iwase",

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N2 - Electrical interface material (EIM) is an important component to develop stretchable electronics. Currently available EIMs suffer from the trade-off between low value and stretch tolerance of contact resistance. To overcome this challenge, we demonstrated the use of liquid metal (LM) as an EIM between solid metal (SM) pads for stretchable electronic devices. With LM, we achieved low contact resistance with temporal stability and stretch tolerance. Our study suggested that the contact resistance between an LM and an SM decreases over time due to alloying, and the contact resistance was reduced to 18.6% in 103 days by ensuring the electrical connection under vacuum during the fabrication. Furthermore, the use of the LM as an EIM enabled maintaining the change in contact resistance below 9% during 100% stretching deformation repeated 100 times. These results suggest that LM can be used as an EIM with temporal stability and stretch tolerance.

AB - Electrical interface material (EIM) is an important component to develop stretchable electronics. Currently available EIMs suffer from the trade-off between low value and stretch tolerance of contact resistance. To overcome this challenge, we demonstrated the use of liquid metal (LM) as an EIM between solid metal (SM) pads for stretchable electronic devices. With LM, we achieved low contact resistance with temporal stability and stretch tolerance. Our study suggested that the contact resistance between an LM and an SM decreases over time due to alloying, and the contact resistance was reduced to 18.6% in 103 days by ensuring the electrical connection under vacuum during the fabrication. Furthermore, the use of the LM as an EIM enabled maintaining the change in contact resistance below 9% during 100% stretching deformation repeated 100 times. These results suggest that LM can be used as an EIM with temporal stability and stretch tolerance.

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Liquid Metal as Electrical Interface Material with Temporal Stability and Stretch Tolerance

Abstract

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Keywords

ASJC Scopus subject areas

Access to Document

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