Abstract
The structure of a clean Si(001) surface has been studied by a specialized technique in low-energy ion scattering spectroscopy. It has been found that (1) the surface is dimerized, and (2) the intradimer atomic distance parallel to the surface is 2.4 ± 0.1.
| Original language | English |
|---|---|
| Pages (from-to) | 567-570 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 49 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 1982 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
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Low-energy ion scattering from the Si(001) surface. / Aono, M.; Hou, Y.; Oshima, C.; Ishizawa, Y.
In: Physical Review Letters, Vol. 49, No. 8, 1982, p. 567-570.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Low-energy ion scattering from the Si(001) surface
AU - Aono, M.
AU - Hou, Y.
AU - Oshima, C.
AU - Ishizawa, Y.
PY - 1982
Y1 - 1982
N2 - The structure of a clean Si(001) surface has been studied by a specialized technique in low-energy ion scattering spectroscopy. It has been found that (1) the surface is dimerized, and (2) the intradimer atomic distance parallel to the surface is 2.4 ± 0.1.
AB - The structure of a clean Si(001) surface has been studied by a specialized technique in low-energy ion scattering spectroscopy. It has been found that (1) the surface is dimerized, and (2) the intradimer atomic distance parallel to the surface is 2.4 ± 0.1.
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UR - http://www.scopus.com/inward/citedby.url?scp=4243298807&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.49.567
DO - 10.1103/PhysRevLett.49.567
M3 - Article
AN - SCOPUS:4243298807
VL - 49
SP - 567
EP - 570
JO - Physical Review Letters
JF - Physical Review Letters
SN - 0031-9007
IS - 8
ER -