Low-glancing-angle x-ray diffraction study on the relationship between crystallinity and properties of C60 field effect transistor

Hirotaka Ohashi, Katsumi Tanigaki, Ryotaro Kumashiro, Syuji Sugihara, Nobuya Hiroshiba, Shigeru Kimura, Kenichi Kato, Masaki Takata

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)

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Physics & Astronomy