Low ON-Resistance (2.5 mΩ · cm2) Vertical-Type 2-D Hole Gas Diamond MOSFETs with Trench Gate Structure

Jun Tsunoda, Masayuki Iwataki, Kiyotaka Horikawa, Shotaro Amano, Kosuke Ota, Atsushi Hiraiwa, Hiroshi Kawarada

Research output: Contribution to journalArticlepeer-review

Abstract

Diamonds are highly favored materials in high-temperature and high-power operations owing to their excellent characteristics, and diamond p-channel field-effect transistors (p-FETs) considerably aid in the improvement of CMOS technology, providing high performance, which is essential for inverter operations. This study demonstrates a low ON-resistance (001) vertical-type two-dimensional hole gas (2-DHG) diamond metal-oxide-semiconductor field-effect transistor (MOSFET) with a trench gate structure. The active area of the device reduced after introducing a trench gate structure that can significantly improve the device integration and high-current operation. The maximum drain current density ( {I}_{\text{D}} ) exceeds 20 kA/cm2 at {V}_{\text{DS}} = -50 V and {V}_{\text{GS}} = -20 V, which is the highest value obtained for (001) vertical-type diamond MOSFETs. This vertical-type diamond trench MOSFET can obtain the lowest ON-resistance ( {R}_{\mathrm{\scriptstyle{ON}}}\text{S} ) of 2.5 \text{m}\Omega \cdot \text{cm}^{2} , which is comparable to that of SiC and GaN vertical-type n-channel FETs (n-FETs). It can be potentially used as a p-channel power FET in a complementary inverter. Furthermore, this study demonstrates that the trench contact depth to the p+ diamond substrate significantly impacts the static characteristics of a device using the ATLAS device simulation. This result significantly contributes to the improvement of the rising drain current in the low-voltage region of the vertical-type diamond FET, which can be used in the future as p-channel power devices for the next generation of complementary inverters using GaN or SiC MOSFETs as n-channels.

Original languageEnglish
Article number9447208
Pages (from-to)3490-3496
Number of pages7
JournalIEEE Transactions on Electron Devices
Volume68
Issue number7
DOIs
Publication statusPublished - 2021 Jul

Keywords

  • Diamond
  • metal-oxide-semiconductor field-effect transistor (MOSFET)
  • power device
  • trench gate structure
  • vertical-type

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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