Low-temperature field emission system for development of ultracoherent electron beams

B. Cho, T. Ogawa, T. Ichimura, T. Ichinokawa, T. Amakusa, C. Oshima

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Here, we present the design and test-operation performance of a low-temperature field emission (FE) system which can be employed to image and characterize the FE beam from low-temperature tips. Three radiation shields cooled by liquid helium and liquid nitrogen cryostats surround the FE tips and anodes completely. Once the FE system is cooled down to 5 K, experiments can run for more than 15 h without interruption. The design allows not only for the exchange of tips and anodes by load-lock equipment but also for the adjustment of tip-anode distance using a piezo-tube. Test runs in projection microscopy mode have presented clear diffraction-fringe patterns near the shadows of nano objects at temperatures from room temperature to 5.5 K, indicating that the system is well suited for the investigation of the coherence of electron beam from FE tip.

Original languageEnglish
Pages (from-to)3091-3096
Number of pages6
JournalReview of Scientific Instruments
Volume75
Issue number10 I
DOIs
Publication statusPublished - 2004 Oct

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

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    Cho, B., Ogawa, T., Ichimura, T., Ichinokawa, T., Amakusa, T., & Oshima, C. (2004). Low-temperature field emission system for development of ultracoherent electron beams. Review of Scientific Instruments, 75(10 I), 3091-3096. https://doi.org/10.1063/1.1790581