Low-temperature X-ray powder diffraction of Bi2Sr2CaCu2Ox superconductor

S. Kano, A. Yamazaki, R. Otsuka, M. Ohgaki, S. Nakamura, M. Akao, H. Aoki

Research output: Contribution to journalArticlepeer-review

Abstract

A low-temperature X-ray powder diffractometer has been developed and applied to the measurement of lattice constants of Bi2Sr2CaCu2Ox superconductor at 80 K, only 3 K higher than the critical temperature. The relationship between the lattice constants and electrical resistivity was studied. The Bi2Sr2CaCu2Ox sample was prepared by solid-state reaction and sintered by a hot-press system at 750°C. Lattice constants of the Bi2Sr2CaCu2Cx were measured at 293 to 80 K. The electrical resistivity of the sample, measured by the standard four-probe method, reached 0 Ω cm at 77 K. The resistivity decreased rapidly along with rapid shrinkage of the c-axial length.

Original languageEnglish
Pages (from-to)249-253
Number of pages5
JournalPhase Transitions
Volume41
Issue number1-4
DOIs
Publication statusPublished - 1993 Jan 1

Keywords

  • BiSrCaCuO
  • Low-temperature X-ray powder diffractometer
  • c-axial length
  • electrical resistivity

ASJC Scopus subject areas

  • Instrumentation
  • Materials Science(all)

Fingerprint

Dive into the research topics of 'Low-temperature X-ray powder diffraction of Bi<sub>2</sub>Sr<sub>2</sub>CaCu<sub>2</sub>O<sub>x</sub> superconductor'. Together they form a unique fingerprint.

Cite this