Low-temperature X-ray powder diffraction of Bi2Sr2CaCu2Ox superconductor

S. Kano, Atsushi Yamazaki, R. Otsuka, M. Ohgaki, S. Nakamura, M. Akao, H. Aoki

    Research output: Contribution to journalArticlepeer-review


    A low-temperature X-ray powder diffractometer has been developed and applied to the measurement of lattice constants of Bi2Sr2CaCu2Ox superconductor at 80 K, only 3 K higher than the critical temperature. The relationship between the lattice constants and electrical resistivity was studied. The Bi2Sr2CaCu2Ox sample was prepared by solid-state reaction and sintered by a hot-press system at 750°C. Lattice constants of the Bi2Sr2CaCu2Cx were measured at 293 to 80 K. The electrical resistivity of the sample, measured by the standard four-probe method, reached 0 Ω cm at 77 K. The resistivity decreased rapidly along with rapid shrinkage of the c-axial length.

    Original languageEnglish
    Pages (from-to)249-253
    Number of pages5
    JournalPhase Transitions
    Issue number1-4
    Publication statusPublished - 1993 Jan 1


    • BiSrCaCuO
    • c-axial length
    • electrical resistivity
    • Low-temperature X-ray powder diffractometer

    ASJC Scopus subject areas

    • Materials Science(all)
    • Instrumentation

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