Abstract
Optical spectra of the bulk three-dimensional InGaN alloys were measured using the commercially available light-emitting diode devices and their wafers. The emission from undoped InxGa1-xN (x<0.1) was assigned to the recombination of excitons localized at the potential minima originating from the large compositional fluctuation. The emission from heavily impurity-doped InGaN was also pointed out related to the localized states.
Original language | English |
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Pages (from-to) | 2822-2824 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 70 |
Issue number | 21 |
DOIs | |
Publication status | Published - 1997 May 26 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)