TY - JOUR
T1 - Magnetic after-effect in amorphous Tb–Fe thin films
AU - Ohashi, Keishi
AU - Tsuji, Hisao
AU - Tsunashima, Shigeru
AU - Uchiyama, Susumu
PY - 1980/7
Y1 - 1980/7
N2 - Magnetic after-effect in sputter deposited TbxFe1−x (x×0.17∼0.24) films is studied. The after-effect is directly observed using polar Kerr magneto-optic effect as a slow propagation of domain walls. The velocity of the domain growth (10−4∼10−1 cm/s) changes exponentially with the applied field. The viscosity coefficient Sv≡dM/d ln t·χ−1 (χ: irreversible susceptibility), which was used in describing Jordan type after-effect, is applied to characterize the after-effect. The value of Sv (22∼110 Oe) is inversely proportional to the saturation magnetization at room temperature and decreases with rising temperature. The origin of the slow wall motion is inferred to be the random anisotropy of Tb ion rather than the oxidation of the film surface.
AB - Magnetic after-effect in sputter deposited TbxFe1−x (x×0.17∼0.24) films is studied. The after-effect is directly observed using polar Kerr magneto-optic effect as a slow propagation of domain walls. The velocity of the domain growth (10−4∼10−1 cm/s) changes exponentially with the applied field. The viscosity coefficient Sv≡dM/d ln t·χ−1 (χ: irreversible susceptibility), which was used in describing Jordan type after-effect, is applied to characterize the after-effect. The value of Sv (22∼110 Oe) is inversely proportional to the saturation magnetization at room temperature and decreases with rising temperature. The origin of the slow wall motion is inferred to be the random anisotropy of Tb ion rather than the oxidation of the film surface.
UR - http://www.scopus.com/inward/record.url?scp=0019033264&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0019033264&partnerID=8YFLogxK
U2 - 10.1143/JJAP.19.1333
DO - 10.1143/JJAP.19.1333
M3 - Article
AN - SCOPUS:0019033264
VL - 19
SP - 1333
EP - 1338
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 7
ER -