TY - JOUR
T1 - Magnetic force microscopy analysis of the micromagnetization mode of double-layered perpendicular magnetic recording media
AU - Homma, T.
AU - Kurokawa, Y.
AU - Nakamura, T.
AU - Osaka, T.
AU - Otsuka, I.
PY - 1996
Y1 - 1996
N2 - The micromagnetization mode of double-layered (DL) perpendicular magnetic recording (PMR) media, as well as the single-layered one, was investigated by a magnetic force microscopy (MFM) in order to clarify the origin of their recording characteristics. The DL media were flexible disks consisting of a CoNiReP PMR layer and a CoB (soft magnetic) or CoNiP (hard magnetic) underlayer, which were recorded using a ring-type head. Due to the variation in the underlayer characteristics, a clear difference in the stray field gradient at the transition region of the recorded magnetization was observed for the first time, which proved the validity of the presumed model for their magnetization mode. Such a direct analysis of the micromagnetization mode is possible only by MFM, and this technique is considered to be indispensable for optimizing the total design of PMR systems.
AB - The micromagnetization mode of double-layered (DL) perpendicular magnetic recording (PMR) media, as well as the single-layered one, was investigated by a magnetic force microscopy (MFM) in order to clarify the origin of their recording characteristics. The DL media were flexible disks consisting of a CoNiReP PMR layer and a CoB (soft magnetic) or CoNiP (hard magnetic) underlayer, which were recorded using a ring-type head. Due to the variation in the underlayer characteristics, a clear difference in the stray field gradient at the transition region of the recorded magnetization was observed for the first time, which proved the validity of the presumed model for their magnetization mode. Such a direct analysis of the micromagnetization mode is possible only by MFM, and this technique is considered to be indispensable for optimizing the total design of PMR systems.
UR - http://www.scopus.com/inward/record.url?scp=0039887317&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0039887317&partnerID=8YFLogxK
U2 - 10.1116/1.588510
DO - 10.1116/1.588510
M3 - Article
AN - SCOPUS:0039887317
SN - 1071-1023
VL - 14
SP - 1184
EP - 1187
JO - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
IS - 2
ER -