Measurement of hole mobility in dielectric liquids

Naoshi Hirai, K. Arii, H. Kikuchi, T. Masoaka, H. Nitanada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Breakdown phenomena of dielectric liquids for a needle/plane electrode have been investigated. It was evident the hole influenced greatly the breakdown of dielectric liquids. In this paper, we report hole production and measurement of hole mobility in dielectric liquids. The electron and hole were injected from NESA glass electrode into cyclohexane by the irradiation of KrF excimer laser. The NESA was coated with ITO (Indium tin oxide). The analysis of electron and hole mobility is discussed.

Original languageEnglish
Title of host publicationProceedings of the 11th International Conference on Conduction and
PublisherPubl by IEEE
Pages101-105
Number of pages5
ISBN (Print)0780307925
Publication statusPublished - 1993
Externally publishedYes
EventProceedings of the IEEE 11th International Conference on Conduction and Breakdown in Dielectric Liquids (ICDL) - Baden-Dattwil, Switz
Duration: 1993 Jul 191993 Jul 23

Other

OtherProceedings of the IEEE 11th International Conference on Conduction and Breakdown in Dielectric Liquids (ICDL)
CityBaden-Dattwil, Switz
Period93/7/1993/7/23

Fingerprint

Dielectric liquids
Hole mobility
Electrodes
Electron mobility
Excimer lasers
Cyclohexane
Tin oxides
Needles
Indium
Irradiation
Glass
Electrons

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Hirai, N., Arii, K., Kikuchi, H., Masoaka, T., & Nitanada, H. (1993). Measurement of hole mobility in dielectric liquids. In Proceedings of the 11th International Conference on Conduction and (pp. 101-105). Publ by IEEE.

Measurement of hole mobility in dielectric liquids. / Hirai, Naoshi; Arii, K.; Kikuchi, H.; Masoaka, T.; Nitanada, H.

Proceedings of the 11th International Conference on Conduction and. Publ by IEEE, 1993. p. 101-105.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hirai, N, Arii, K, Kikuchi, H, Masoaka, T & Nitanada, H 1993, Measurement of hole mobility in dielectric liquids. in Proceedings of the 11th International Conference on Conduction and. Publ by IEEE, pp. 101-105, Proceedings of the IEEE 11th International Conference on Conduction and Breakdown in Dielectric Liquids (ICDL), Baden-Dattwil, Switz, 93/7/19.
Hirai N, Arii K, Kikuchi H, Masoaka T, Nitanada H. Measurement of hole mobility in dielectric liquids. In Proceedings of the 11th International Conference on Conduction and. Publ by IEEE. 1993. p. 101-105
Hirai, Naoshi ; Arii, K. ; Kikuchi, H. ; Masoaka, T. ; Nitanada, H. / Measurement of hole mobility in dielectric liquids. Proceedings of the 11th International Conference on Conduction and. Publ by IEEE, 1993. pp. 101-105
@inproceedings{6efd5e046326425dae027651b050dd5a,
title = "Measurement of hole mobility in dielectric liquids",
abstract = "Breakdown phenomena of dielectric liquids for a needle/plane electrode have been investigated. It was evident the hole influenced greatly the breakdown of dielectric liquids. In this paper, we report hole production and measurement of hole mobility in dielectric liquids. The electron and hole were injected from NESA glass electrode into cyclohexane by the irradiation of KrF excimer laser. The NESA was coated with ITO (Indium tin oxide). The analysis of electron and hole mobility is discussed.",
author = "Naoshi Hirai and K. Arii and H. Kikuchi and T. Masoaka and H. Nitanada",
year = "1993",
language = "English",
isbn = "0780307925",
pages = "101--105",
booktitle = "Proceedings of the 11th International Conference on Conduction and",
publisher = "Publ by IEEE",

}

TY - GEN

T1 - Measurement of hole mobility in dielectric liquids

AU - Hirai, Naoshi

AU - Arii, K.

AU - Kikuchi, H.

AU - Masoaka, T.

AU - Nitanada, H.

PY - 1993

Y1 - 1993

N2 - Breakdown phenomena of dielectric liquids for a needle/plane electrode have been investigated. It was evident the hole influenced greatly the breakdown of dielectric liquids. In this paper, we report hole production and measurement of hole mobility in dielectric liquids. The electron and hole were injected from NESA glass electrode into cyclohexane by the irradiation of KrF excimer laser. The NESA was coated with ITO (Indium tin oxide). The analysis of electron and hole mobility is discussed.

AB - Breakdown phenomena of dielectric liquids for a needle/plane electrode have been investigated. It was evident the hole influenced greatly the breakdown of dielectric liquids. In this paper, we report hole production and measurement of hole mobility in dielectric liquids. The electron and hole were injected from NESA glass electrode into cyclohexane by the irradiation of KrF excimer laser. The NESA was coated with ITO (Indium tin oxide). The analysis of electron and hole mobility is discussed.

UR - http://www.scopus.com/inward/record.url?scp=0027858008&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027858008&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0027858008

SN - 0780307925

SP - 101

EP - 105

BT - Proceedings of the 11th International Conference on Conduction and

PB - Publ by IEEE

ER -