Measurement of hole mobility in dielectric liquids

N. Hirai, K. Arii, H. Kikuchi, T. Masoaka, H. Nitanada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Breakdown phenomena of dielectric liquids for a needle/plane electrode have been investigated. It was evident the hole influenced greatly the breakdown of dielectric liquids. In this paper, we report hole production and measurement of hole mobility in dielectric liquids. The electron and hole were injected from NESA glass electrode into cyclohexane by the irradiation of KrF excimer laser. The NESA was coated with ITO (Indium tin oxide). The analysis of electron and hole mobility is discussed.

Original languageEnglish
Title of host publicationProceedings of the 11th International Conference on Conduction and
PublisherPubl by IEEE
Pages101-105
Number of pages5
ISBN (Print)0780307925
Publication statusPublished - 1993 Dec 1
Externally publishedYes
EventProceedings of the IEEE 11th International Conference on Conduction and Breakdown in Dielectric Liquids (ICDL) - Baden-Dattwil, Switz
Duration: 1993 Jul 191993 Jul 23

Publication series

NameProceedings of the 11th International Conference on Conduction and

Other

OtherProceedings of the IEEE 11th International Conference on Conduction and Breakdown in Dielectric Liquids (ICDL)
CityBaden-Dattwil, Switz
Period93/7/1993/7/23

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Hirai, N., Arii, K., Kikuchi, H., Masoaka, T., & Nitanada, H. (1993). Measurement of hole mobility in dielectric liquids. In Proceedings of the 11th International Conference on Conduction and (pp. 101-105). (Proceedings of the 11th International Conference on Conduction and). Publ by IEEE.