Measurement of nanometer electron beam sizes using laser interference by Shintake Monitor

Jacqueline Yan, Yoshio Kamiya, Sachio Komamiya, Toshiyuki Okugi, Nobuhiro Terunuma, Kiyoshi Kubo, Toshiaki Tauchi

Research output: Contribution to journalConference article

Abstract

The Shintake Monitor is an essential beam tuning device installed at the interaction point of ATF2, the final focus test beam line for ILC, to measure its O(10) nm order vertical e- beam sizes (σy). The e-beam collides with a target of laser interference fringes, and σy is derived from the modulation depth of the resulting Compton signal photons measured by a downstream photon detector. The laser optics is designed to accommodate a wide range of σy from 25 nm to a few μm with better than 10% accuracy. Being the only existing device capable of measuring σy < 100 nm, the Shintake Monitor is crucial for verifying ATF2's Goal 1 of focusing σy down to the design value of 37 nm. It has demonstrated measurement stability of about 5%. Major improvements in hardware and measurement schemes contributed to suppressing error sources. This paper describes the design concepts and performance of Shintake Monitor, focusing on an extensive study of systematic errors with the aim of precisely extracting σy from the measured modulation.

Original languageEnglish
Article number127
JournalProceedings of Science
Volume0
Publication statusPublished - 2014 Jan 1
Externally publishedYes
Event3rd Technology and Instrumentation in Particle Physics Conference, TIPP 2014 - Amsterdam, Netherlands
Duration: 2014 Jun 22014 Jun 6

ASJC Scopus subject areas

  • General

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    Yan, J., Kamiya, Y., Komamiya, S., Okugi, T., Terunuma, N., Kubo, K., & Tauchi, T. (2014). Measurement of nanometer electron beam sizes using laser interference by Shintake Monitor. Proceedings of Science, 0, [127].