Measurement of nanometer electron beam sizes with laser interference using Shintake Monitor

Jacqueline Yan, Yohei Yamaguchi, Yoshio Kamiya, Sachio Komamiya, Masahiro Oroku, Toshiyuki Okugi, Nobuhiro Terunuma, Kiyoshi Kubo, Toshiaki Tauchi, Junji Urakawa

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The Shintake Monitor is an essential beam tuning device installed at the interaction point (IP) of ATF2 [1], the final focus test beam line of the Accelerator Test Facility (ATF) to measure its nanometer order vertical e - beam sizes (σy *). The e - beam collides with a target of laser interference fringes, and σy * is derived from the modulation depth of the resulting Compton signal photons measured by a downstream photon detector. By switching between several laser crossing angle modes, it is designed to accommodate a wide range of σy * from 20 nm to a few micrometers with better than 10% accuracy. Owing to this ingenious technique, Shintake Monitor1 [2,3] is the only existing device capable of measuring σy *<100 nm, and is crucial for verifying ATF2's Goal 1 of focusing σy * down to the design value of 37 nm. Shintake Monitor has demonstrated stable σy * measurement with 5-10% stability. Major improvements in hardware and measurement schemes contributed to the suppression of error sources. This paper describes the design concepts and beam time performance of Shintake Monitor, as well as an extensive study of systematic errors with the aim of precisely extracting σy * from the measured modulation.

Original languageEnglish
Pages (from-to)131-137
Number of pages7
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume740
DOIs
Publication statusPublished - 2014 Mar 11
Externally publishedYes

Fingerprint

monitors
Electron beams
Photons
Modulation
electron beams
interference
Lasers
Systematic errors
Laser modes
Test facilities
Particle accelerators
lasers
Tuning
Detectors
Hardware
modulation
photons
test facilities
systematic errors
micrometers

Keywords

  • Beam size
  • ILC
  • IP
  • Laser
  • Shintake Monitor

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

Measurement of nanometer electron beam sizes with laser interference using Shintake Monitor. / Yan, Jacqueline; Yamaguchi, Yohei; Kamiya, Yoshio; Komamiya, Sachio; Oroku, Masahiro; Okugi, Toshiyuki; Terunuma, Nobuhiro; Kubo, Kiyoshi; Tauchi, Toshiaki; Urakawa, Junji.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 740, 11.03.2014, p. 131-137.

Research output: Contribution to journalArticle

Yan, Jacqueline ; Yamaguchi, Yohei ; Kamiya, Yoshio ; Komamiya, Sachio ; Oroku, Masahiro ; Okugi, Toshiyuki ; Terunuma, Nobuhiro ; Kubo, Kiyoshi ; Tauchi, Toshiaki ; Urakawa, Junji. / Measurement of nanometer electron beam sizes with laser interference using Shintake Monitor. In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2014 ; Vol. 740. pp. 131-137.
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