Measurement of nanometer electron beam sizes with laser interference using IPBSM

Jacqueline Yan, Sachio Komamiya, Masahiro Oroku, Taikan Suehara, Yohei Yamaguchi, Takashi Yamanaka, Yoshio Kamiya, Sakae Araki, Toshiyuki Okugi, Toshiaki Tauchi, Nobuhiro Terunuma, Junji Urakawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An e- beam size monitor, called the “Shintake Monitor” (or “IPBSM”), is installed at ATF2’s virtual interaction point (“IP”). It plays a crucial role in achieving ATF2’s Goal 1 of focusing the vertical e- beam size (σy*) down to a design value of 37 nm, using an ingenious technique of colliding the e- beam against a target of laser interference fringes. σy* is derived from the modulation depth of the resulting Compton signal photons measured by a downstream γ detector. IPBSM is the only existing device capable of measuring σy* as small as 20 nm with better than 10% resolution, and can accommodate a wide range of σy* up to a few μm by switching between laser crossing angles θ = 174°, 30°, and 2° - 8° according to beam tuning status. The effects of several major hardware upgrades have been confirmed during beam time, such as through suppressed signal jitters, improved resolution and stable measurements of σy* down to about 150 nm by Feb 2012. The aims of the extensive 2012 summer reform implemented upon the laser optics are higher reliability and reproducibility in alignment. Our goal for the autumn 2012 run is to stably measure σy* < 50 nm. This paper describes the system’s design, role in beam tuning, and various efforts to further improve its performance.

Original languageEnglish
Title of host publicationIBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference
PublisherJoint Accelerator Conferences Website (JACoW)
Pages310-314
Number of pages5
ISBN (Electronic)9783954501199
Publication statusPublished - 2013 Jun 1
Event1st International Beam Instrumentation Conference, IBIC 2012 - Tsukuba, Japan
Duration: 2012 Oct 12012 Oct 4

Publication series

NameIBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference

Conference

Conference1st International Beam Instrumentation Conference, IBIC 2012
CountryJapan
CityTsukuba
Period12/10/112/10/4

Fingerprint

Electron beams
Tuning
electron beams
Laser optics
interference
Lasers
Jitter
lasers
Photons
Systems analysis
Modulation
Detectors
Hardware
monitors
tuning
autumn
systems engineering
summer
hardware
alignment

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

Yan, J., Komamiya, S., Oroku, M., Suehara, T., Yamaguchi, Y., Yamanaka, T., ... Urakawa, J. (2013). Measurement of nanometer electron beam sizes with laser interference using IPBSM. In IBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference (pp. 310-314). (IBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference). Joint Accelerator Conferences Website (JACoW).

Measurement of nanometer electron beam sizes with laser interference using IPBSM. / Yan, Jacqueline; Komamiya, Sachio; Oroku, Masahiro; Suehara, Taikan; Yamaguchi, Yohei; Yamanaka, Takashi; Kamiya, Yoshio; Araki, Sakae; Okugi, Toshiyuki; Tauchi, Toshiaki; Terunuma, Nobuhiro; Urakawa, Junji.

IBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference. Joint Accelerator Conferences Website (JACoW), 2013. p. 310-314 (IBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yan, J, Komamiya, S, Oroku, M, Suehara, T, Yamaguchi, Y, Yamanaka, T, Kamiya, Y, Araki, S, Okugi, T, Tauchi, T, Terunuma, N & Urakawa, J 2013, Measurement of nanometer electron beam sizes with laser interference using IPBSM. in IBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference. IBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference, Joint Accelerator Conferences Website (JACoW), pp. 310-314, 1st International Beam Instrumentation Conference, IBIC 2012, Tsukuba, Japan, 12/10/1.
Yan J, Komamiya S, Oroku M, Suehara T, Yamaguchi Y, Yamanaka T et al. Measurement of nanometer electron beam sizes with laser interference using IPBSM. In IBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference. Joint Accelerator Conferences Website (JACoW). 2013. p. 310-314. (IBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference).
Yan, Jacqueline ; Komamiya, Sachio ; Oroku, Masahiro ; Suehara, Taikan ; Yamaguchi, Yohei ; Yamanaka, Takashi ; Kamiya, Yoshio ; Araki, Sakae ; Okugi, Toshiyuki ; Tauchi, Toshiaki ; Terunuma, Nobuhiro ; Urakawa, Junji. / Measurement of nanometer electron beam sizes with laser interference using IPBSM. IBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference. Joint Accelerator Conferences Website (JACoW), 2013. pp. 310-314 (IBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference).
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AU - Yamanaka, Takashi

AU - Kamiya, Yoshio

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