Measurement of nanometer electron beam sizes with laser interference using Shintake Monitor

Jacqueline Yan*, Yohei Yamaguchi, Yoshio Kamiya, Sachio Komamiya, Masahiro Oroku, Toshiyuki Okugi, Nobuhiro Terunuma, Kiyoshi Kubo, Toshiaki Tauchi, Junji Urakawa

*Corresponding author for this work

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10 Citations (Scopus)

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