Measurement of residual space charge distribution in gamma-irradiated polyethylene

M. Kojima, Y. Tanaka, T. Takada, Yoshimichi Ohki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

The present paper discusses the residual space charge distribution in gamma-irradiated polyethylene formed with dc voltage, which was measured using the pulsed electroacoustic (PEA) method. The PEA method is one of advanced non-destructive techniques to measure the space charge distribution with a high sensitivity and reproducibility. From the experimental result, it became clear that a large amount of positive charges existing near the cathode in gamma-irradiated polyethylene enhance the electric field at the cathode interface. Under short circuit condition, the strength of this electric field by the space charge is sometimes more than two times of the applied field. On the other hand, almost no space charge was observed in the non-irradiated sample.

Original languageEnglish
Title of host publicationProceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials
Place of PublicationPiscataway, NJ, United States
PublisherIEEE
Pages479-482
Number of pages4
Volume1
Publication statusPublished - 1994
Externally publishedYes
EventProceedings of the 1994 IEEE 4th International Conference on Properties and Applications of Dielectric Materials. Part 2 (of 2) - Brisbane, Aust
Duration: 1994 Jul 31994 Jul 8

Other

OtherProceedings of the 1994 IEEE 4th International Conference on Properties and Applications of Dielectric Materials. Part 2 (of 2)
CityBrisbane, Aust
Period94/7/394/7/8

    Fingerprint

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Kojima, M., Tanaka, Y., Takada, T., & Ohki, Y. (1994). Measurement of residual space charge distribution in gamma-irradiated polyethylene. In Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials (Vol. 1, pp. 479-482). IEEE.