Measurement of SRAM power-up state for PUF applications using an addressable SRAM cell array test structure

Kiyoshi Takeuchi, Tomoko Mizutani, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto, Hirofumi Shinohara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

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Engineering & Materials Science