Measurement of the impact stress in a golf club head

Akira Hasegawa, Akihito Nakai, Eiji Iwase, Kiyoshi Matsumoto, Isao Shimoyama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We directly measured the stresses induced on impact between a golf ball and a golf club head. The strain sensors were embedded into grooves on the face of the club head. 3-axis strain sensors were able to measure one normal stress and two shear stresses at each location. The shear stress directions indicated by the outputs of the sensors were in good agreement with the direction of the ball spin obtained from high speed camera images. The peak of the normal stress and shear stress on the contact face were measured to be 4×108 Pa and 1×108 Pa, respectively.

Original languageEnglish
Title of host publicationMEMS 2010 - The 23rd IEEE International Conference on Micro Electro Mechanical Systems, Technical Digest
Pages592-595
Number of pages4
DOIs
Publication statusPublished - 2010 Jun 1
Externally publishedYes
Event23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010 - Hong Kong, China
Duration: 2010 Jan 242010 Jan 28

Publication series

NameProceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
ISSN (Print)1084-6999

Conference

Conference23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010
CountryChina
CityHong Kong
Period10/1/2410/1/28

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Hasegawa, A., Nakai, A., Iwase, E., Matsumoto, K., & Shimoyama, I. (2010). Measurement of the impact stress in a golf club head. In MEMS 2010 - The 23rd IEEE International Conference on Micro Electro Mechanical Systems, Technical Digest (pp. 592-595). [5442432] (Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)). https://doi.org/10.1109/MEMSYS.2010.5442432