Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

S. Shiraki*, H. Ishii, M. Amano, Y. Nihei, M. Owari, C. Oshima, T. Koshikawa, R. Shimizu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

We have developed an angle-resolving electron energy analyzer with a newly designed input-lens system. In this lens system, angle resolving is accomplished by use of a diffraction-plane aperture. Using this system, both high angular resolution (<0.1°) and high transmission are easily achieved in photoelectron diffraction measurements. In order to evaluate this analyzer, we measured the X-ray photoelectron diffraction (XPED) patterns from CaF2(1 1 1) surface. The angular resolution is easily determined by the size of diffraction-plane aperture. By using the diffraction-plane aperture with the angular resolution of ±0.08° or ±0.04°, many fine structures of XPED patterns become to be clearly measured.

Original languageEnglish
Pages (from-to)29-35
Number of pages7
JournalSurface Science
Volume493
Issue number1-3
DOIs
Publication statusPublished - 2001 Nov 1

Keywords

  • Angle resolved photoemission
  • Halides
  • Photoelectron diffraction

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

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