Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

S. Shiraki; H. Ishii; M. Amano; Y. Nihei; M. Owari; C. Oshima; T. Koshikawa; R. Shimizu

doi:10.1016/S0039-6028(01)01185-2

Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

S. Shiraki^*, H. Ishii, M. Amano, Y. Nihei, M. Owari, C. Oshima, T. Koshikawa, R. Shimizu

^*Corresponding author for this work

Waseda University

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

We have developed an angle-resolving electron energy analyzer with a newly designed input-lens system. In this lens system, angle resolving is accomplished by use of a diffraction-plane aperture. Using this system, both high angular resolution (<0.1°) and high transmission are easily achieved in photoelectron diffraction measurements. In order to evaluate this analyzer, we measured the X-ray photoelectron diffraction (XPED) patterns from CaF₂(1 1 1) surface. The angular resolution is easily determined by the size of diffraction-plane aperture. By using the diffraction-plane aperture with the angular resolution of ±0.08° or ±0.04°, many fine structures of XPED patterns become to be clearly measured.

Original language	English
Pages (from-to)	29-35
Number of pages	7
Journal	Surface Science
Volume	493
Issue number	1-3
DOIs	https://doi.org/10.1016/S0039-6028(01)01185-2
Publication status	Published - 2001 Nov 1

Keywords

Angle resolved photoemission
Halides
Photoelectron diffraction

ASJC Scopus subject areas

Physical and Theoretical Chemistry
Condensed Matter Physics
Surfaces and Interfaces

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10.1016/S0039-6028(01)01185-2

Cite this

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title = "Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer",

abstract = "We have developed an angle-resolving electron energy analyzer with a newly designed input-lens system. In this lens system, angle resolving is accomplished by use of a diffraction-plane aperture. Using this system, both high angular resolution (<0.1°) and high transmission are easily achieved in photoelectron diffraction measurements. In order to evaluate this analyzer, we measured the X-ray photoelectron diffraction (XPED) patterns from CaF2(1 1 1) surface. The angular resolution is easily determined by the size of diffraction-plane aperture. By using the diffraction-plane aperture with the angular resolution of ±0.08° or ±0.04°, many fine structures of XPED patterns become to be clearly measured.",

keywords = "Angle resolved photoemission, Halides, Photoelectron diffraction",

author = "S. Shiraki and H. Ishii and M. Amano and Y. Nihei and M. Owari and C. Oshima and T. Koshikawa and R. Shimizu",

year = "2001",

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language = "English",

volume = "493",

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TY - JOUR

T1 - Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

AU - Shiraki, S.

AU - Ishii, H.

AU - Amano, M.

AU - Nihei, Y.

AU - Owari, M.

AU - Oshima, C.

AU - Koshikawa, T.

AU - Shimizu, R.

PY - 2001/11/1

Y1 - 2001/11/1

N2 - We have developed an angle-resolving electron energy analyzer with a newly designed input-lens system. In this lens system, angle resolving is accomplished by use of a diffraction-plane aperture. Using this system, both high angular resolution (<0.1°) and high transmission are easily achieved in photoelectron diffraction measurements. In order to evaluate this analyzer, we measured the X-ray photoelectron diffraction (XPED) patterns from CaF2(1 1 1) surface. The angular resolution is easily determined by the size of diffraction-plane aperture. By using the diffraction-plane aperture with the angular resolution of ±0.08° or ±0.04°, many fine structures of XPED patterns become to be clearly measured.

AB - We have developed an angle-resolving electron energy analyzer with a newly designed input-lens system. In this lens system, angle resolving is accomplished by use of a diffraction-plane aperture. Using this system, both high angular resolution (<0.1°) and high transmission are easily achieved in photoelectron diffraction measurements. In order to evaluate this analyzer, we measured the X-ray photoelectron diffraction (XPED) patterns from CaF2(1 1 1) surface. The angular resolution is easily determined by the size of diffraction-plane aperture. By using the diffraction-plane aperture with the angular resolution of ±0.08° or ±0.04°, many fine structures of XPED patterns become to be clearly measured.

KW - Angle resolved photoemission

KW - Halides

KW - Photoelectron diffraction

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U2 - 10.1016/S0039-6028(01)01185-2

DO - 10.1016/S0039-6028(01)01185-2

M3 - Article

AN - SCOPUS:0035500848

SN - 0039-6028

VL - 493

SP - 29

EP - 35

JO - Surface Science

JF - Surface Science

IS - 1-3

ER -

Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

Abstract

Keywords

ASJC Scopus subject areas

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