Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

S. Shiraki, H. Ishii, M. Amano, Y. Nihei, M. Owari, C. Oshima, T. Koshikawa, R. Shimizu

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

We have developed an angle-resolving electron energy analyzer with a newly designed input-lens system. In this lens system, angle resolving is accomplished by use of a diffraction-plane aperture. Using this system, both high angular resolution (<0.1°) and high transmission are easily achieved in photoelectron diffraction measurements. In order to evaluate this analyzer, we measured the X-ray photoelectron diffraction (XPED) patterns from CaF2(1 1 1) surface. The angular resolution is easily determined by the size of diffraction-plane aperture. By using the diffraction-plane aperture with the angular resolution of ±0.08° or ±0.04°, many fine structures of XPED patterns become to be clearly measured.

Original languageEnglish
Pages (from-to)29-35
Number of pages7
JournalSurface Science
Volume493
Issue number1-3
DOIs
Publication statusPublished - 2001 Nov 1

Keywords

  • Angle resolved photoemission
  • Halides
  • Photoelectron diffraction

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

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    Shiraki, S., Ishii, H., Amano, M., Nihei, Y., Owari, M., Oshima, C., Koshikawa, T., & Shimizu, R. (2001). Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer. Surface Science, 493(1-3), 29-35. https://doi.org/10.1016/S0039-6028(01)01185-2