Measuring the sizes of nanospheres on a rough surface by using atomic force microscopy and a curvature-reconstruction method

Koudai Oikawa, Hyonchol Kim, Naoya Watanabe, Masatsugu Shigeno, Yoshiharu Shirakawabe, Kenji Yasuda

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

One of the advantages of atomic force microscopy (AFM) is that it can accurately measure the heights of targets on flat substrates. It is difficult, however, to determine the shape of nanoparticles on rough surfaces. We therefore propose a curvature-reconstruction method that estimates the sizes of particles by fitting sphere curvatures acquired from raw AFM data. We evaluated this fitting estimation using 15-, 30-, and 50-nm gold nanoparticles on mica and confirmed that particle sizes could be estimated within 5% from 20% of their curvature measured using a carbon nanotube (CNT) tip. We also estimated the sizes of nanoparticles on the rough surface of dried cells and found we also can estimate the size of those particles within 5%, which is difficult when we only used the height information. The results indicate the size of nanoparticles even on rough surfaces can be measured by using our method and a CNT tip.

Original languageEnglish
Pages (from-to)1061-1067
Number of pages7
JournalUltramicroscopy
Volume107
Issue number10-11
DOIs
Publication statusPublished - 2007 Oct 1
Externally publishedYes

Keywords

  • 018
  • 041
  • Atomic force microscope
  • Carbon nanotube
  • Curvature-reconstruction method
  • Gold nanoparticle
  • Rough surface

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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