TY - JOUR
T1 - Mesoscopic stripes in antiferromagnetic Fe chalcogenide probed by scanning photoelectron spectromicroscopy
AU - Mizokawa, Takashi
AU - Bendele, Markus
AU - Barinov, Alexei
AU - Iadecola, Antonella
AU - Joseph, Boby
AU - Noji, Takashi
AU - Koike, Yoji
AU - Saini, Naurang L.
N1 - Publisher Copyright:
© 2016 The Physical Society of Japan.
PY - 2016
Y1 - 2016
N2 - We have performed scanning photoelectron spectromicroscopy measurements in the paramagnetic (PM) and the antiferromagnetic (AFM) phases of Fe1+δTe (δ = 0.09). The spectromicroscopy images reveal stripe modulation of the electronic structure in the AFM monoclinic phase at low temperature, that disappears at high temperature in the PM phase. The stripes, running along the monoclinic crystal axis, are characterized by different density of states around the Γ point and near the Fermi level (EF). Since the near EF electronic states around the Γ point have strong electron-lattice coupling in Fe1+δTe, the observed stripes are likely to be related to the strain modulation introduced by the monoclinic lattice distortion.
AB - We have performed scanning photoelectron spectromicroscopy measurements in the paramagnetic (PM) and the antiferromagnetic (AFM) phases of Fe1+δTe (δ = 0.09). The spectromicroscopy images reveal stripe modulation of the electronic structure in the AFM monoclinic phase at low temperature, that disappears at high temperature in the PM phase. The stripes, running along the monoclinic crystal axis, are characterized by different density of states around the Γ point and near the Fermi level (EF). Since the near EF electronic states around the Γ point have strong electron-lattice coupling in Fe1+δTe, the observed stripes are likely to be related to the strain modulation introduced by the monoclinic lattice distortion.
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U2 - 10.7566/JPSJ.85.033702
DO - 10.7566/JPSJ.85.033702
M3 - Article
AN - SCOPUS:85008929944
SN - 0031-9015
VL - 85
JO - Journal of the Physical Society of Japan
JF - Journal of the Physical Society of Japan
IS - 3
M1 - 033702
ER -