Message from the Program Chairs

Fraunhofer FOKUS

doi:10.1109/ICST.2017.6

Message from the Program Chairs

Fraunhofer FOKUS

School of Fundamental Science and Engineering

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Article number	7927955
Pages (from-to)	xiii-xiv
Journal	Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017
DOIs	https://doi.org/10.1109/ICST.2017.6
Publication status	Published - 2017 May 15
Event	10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017 - Tokyo, Japan Duration: 2017 Mar 13 → 2017 Mar 17

ASJC Scopus subject areas

Safety, Risk, Reliability and Quality
Software

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10.1109/ICST.2017.6

Cite this

@article{16e2b1b78d504430a1fb066f00b6f02a,

title = "Message from the Program Chairs",

author = "{Fraunhofer FOKUS} and Ina Schieferdecker and Hironori Washizaki",

year = "2017",

month = may,

day = "15",

doi = "10.1109/ICST.2017.6",

language = "English",

pages = "xiii--xiv",

journal = "Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017",

note = "10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017 ; Conference date: 13-03-2017 Through 17-03-2017",

}

TY - JOUR

T1 - Message from the Program Chairs

AU - Fraunhofer FOKUS

AU - Schieferdecker, Ina

AU - Washizaki, Hironori

PY - 2017/5/15

Y1 - 2017/5/15

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U2 - 10.1109/ICST.2017.6

DO - 10.1109/ICST.2017.6

M3 - Editorial

AN - SCOPUS:85020723434

SP - xiii-xiv

JO - Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017

JF - Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017

M1 - 7927955

T2 - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017

Y2 - 13 March 2017 through 17 March 2017

ER -

Message from the Program Chairs

ASJC Scopus subject areas

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