TY - GEN
T1 - Metric learning based on outlier sample elimination for person re-identification
AU - Ismail, Rima Ruktiari
AU - Kamata, Sei Ichiro
N1 - Publisher Copyright:
Copyright © 2018 SPIE.
Copyright:
Copyright 2019 Elsevier B.V., All rights reserved.
PY - 2018
Y1 - 2018
N2 - Person re-identification is a task that aims to recognize a person of interest between two non-overlapping cameras. However, because of different camera angles and quality of the camera, person re-identification is becoming challenging task until now. Many existing methods have been proposed to solve these kinds of problems. Metric learning is already becoming a hot research topic especially for the effectiveness in matching person images problem. For metric learning process, most of them utilize all sample pairs without considering the ratio between distance of each pair. However, not all pairs are useful for the training process. We consider that there are some outliers that can not give good effect in the learning process. For example, a distance too far or too close can influence other samples and mislead the training process, resulting in longer training process time, less accuracy, and other bad effects. In this paper, we propose a new method based on eliminating the outliers, which is called Outlier Sample Elimination. Our method divides negative pairs into three groups using some thresholds to find the proper sample for learning process. During the learning process, we only use the best sample pairs to take into account in our loss function. We eliminate other samples that are considered as outliers.We try to evaluate our proposed method using the challenging VIPeR dataset. Our experiment shows that our method achieves a competitive performance.
AB - Person re-identification is a task that aims to recognize a person of interest between two non-overlapping cameras. However, because of different camera angles and quality of the camera, person re-identification is becoming challenging task until now. Many existing methods have been proposed to solve these kinds of problems. Metric learning is already becoming a hot research topic especially for the effectiveness in matching person images problem. For metric learning process, most of them utilize all sample pairs without considering the ratio between distance of each pair. However, not all pairs are useful for the training process. We consider that there are some outliers that can not give good effect in the learning process. For example, a distance too far or too close can influence other samples and mislead the training process, resulting in longer training process time, less accuracy, and other bad effects. In this paper, we propose a new method based on eliminating the outliers, which is called Outlier Sample Elimination. Our method divides negative pairs into three groups using some thresholds to find the proper sample for learning process. During the learning process, we only use the best sample pairs to take into account in our loss function. We eliminate other samples that are considered as outliers.We try to evaluate our proposed method using the challenging VIPeR dataset. Our experiment shows that our method achieves a competitive performance.
KW - Metric Learning
KW - Outlier
KW - Person Re-Identification
UR - http://www.scopus.com/inward/record.url?scp=85062437693&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85062437693&partnerID=8YFLogxK
U2 - 10.1117/12.2326993
DO - 10.1117/12.2326993
M3 - Conference contribution
AN - SCOPUS:85062437693
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 2018 International Conference on Image and Video Processing, and Artificial Intelligence
A2 - Su, Ruidan
PB - SPIE
T2 - 2018 International Conference on Image and Video Processing, and Artificial Intelligence, IVPAI 2018
Y2 - 15 August 2018 through 17 August 2018
ER -