Metrics Visualization Technique Based on the Origins and Function Layers for OSS-Based Development

Ryosuke Ishizue, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa, Katsushi Namba

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)

    Abstract

    Software developments involving multiple organizations such as OSS (Open Source Software)-based projects tend to have numerous defects when one organization develops and another organization edits the program source code files. Developments with complex file creation, modification history (origin), and software architecture (functional layer) are increasing in OSS-based development. As an example, here we focus on an Android smart phone development project and propose new visualization techniques for product metrics based on the file origin and functional layers. One is the Metrics Area Figure, which can express duplication of edits by multiple organizations intuitively using overlapping figures. The other is Origin City, which was inspired by Code City. It can represent the scale and other measurements, while simultaneously stacking functional layers as 3D buildings.

    Original languageEnglish
    Title of host publicationProceedings - 2016 IEEE Working Conference on Software Visualization, VISSOFT 2016
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages71-75
    Number of pages5
    ISBN (Electronic)9781509038503
    DOIs
    Publication statusPublished - 2016 Dec 9
    Event4th IEEE Working Conference on Software Visualization, VISSOFT 2016 - Raleigh, United States
    Duration: 2016 Oct 32016 Oct 4

    Other

    Other4th IEEE Working Conference on Software Visualization, VISSOFT 2016
    CountryUnited States
    CityRaleigh
    Period16/10/316/10/4

    Fingerprint

    Open Source Software
    Visualization
    Metric
    Figure
    Stacking
    Software Architecture
    Duplication
    Software Development
    Overlapping
    Software architecture
    Express
    Defects
    Tend
    Software engineering
    Open source software

    Keywords

    • functional layer
    • metrics
    • origin

    ASJC Scopus subject areas

    • Software
    • Modelling and Simulation

    Cite this

    Ishizue, R., Washizaki, H., Fukazawa, Y., Inoue, S., Hanai, Y., Kanazawa, M., & Namba, K. (2016). Metrics Visualization Technique Based on the Origins and Function Layers for OSS-Based Development. In Proceedings - 2016 IEEE Working Conference on Software Visualization, VISSOFT 2016 (pp. 71-75). [7780159] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VISSOFT.2016.12

    Metrics Visualization Technique Based on the Origins and Function Layers for OSS-Based Development. / Ishizue, Ryosuke; Washizaki, Hironori; Fukazawa, Yoshiaki; Inoue, Sakae; Hanai, Yoshiiku; Kanazawa, Masanobu; Namba, Katsushi.

    Proceedings - 2016 IEEE Working Conference on Software Visualization, VISSOFT 2016. Institute of Electrical and Electronics Engineers Inc., 2016. p. 71-75 7780159.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Ishizue, R, Washizaki, H, Fukazawa, Y, Inoue, S, Hanai, Y, Kanazawa, M & Namba, K 2016, Metrics Visualization Technique Based on the Origins and Function Layers for OSS-Based Development. in Proceedings - 2016 IEEE Working Conference on Software Visualization, VISSOFT 2016., 7780159, Institute of Electrical and Electronics Engineers Inc., pp. 71-75, 4th IEEE Working Conference on Software Visualization, VISSOFT 2016, Raleigh, United States, 16/10/3. https://doi.org/10.1109/VISSOFT.2016.12
    Ishizue R, Washizaki H, Fukazawa Y, Inoue S, Hanai Y, Kanazawa M et al. Metrics Visualization Technique Based on the Origins and Function Layers for OSS-Based Development. In Proceedings - 2016 IEEE Working Conference on Software Visualization, VISSOFT 2016. Institute of Electrical and Electronics Engineers Inc. 2016. p. 71-75. 7780159 https://doi.org/10.1109/VISSOFT.2016.12
    Ishizue, Ryosuke ; Washizaki, Hironori ; Fukazawa, Yoshiaki ; Inoue, Sakae ; Hanai, Yoshiiku ; Kanazawa, Masanobu ; Namba, Katsushi. / Metrics Visualization Technique Based on the Origins and Function Layers for OSS-Based Development. Proceedings - 2016 IEEE Working Conference on Software Visualization, VISSOFT 2016. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 71-75
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