Microscopic Analysis of Dynamic Loading-induced Fractures by Using Micro CT

Mitsuhiro Yokota, S. H. Cho, M. Ito, Shuji Owada, K. Kaneko

    Research output: Chapter in Book/Report/Conference proceedingChapter

    Abstract

    The purpose of this study is to reveal the mechanism of the high-voltage electric pulsed test. The artificial samples were tested by the high-voltage electric pulsed test. Toestimate the current path and analyze the fractures at grain boundaries, the samples were observed by using Micro CT, before and after the test. The fracture patterns were divided into 2 types, being the "multi fracture pattern" and the "single fracture pattern".

    Original languageEnglish
    Title of host publicationAdvances in X-ray Tomography for Geomaterials
    PublisherWiley-ISTE
    Pages237-243
    Number of pages7
    ISBN (Print)1905209606, 9781905209606
    DOIs
    Publication statusPublished - 2010 Jan 22

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    Keywords

    • Fracture pattern
    • High-voltage pulses
    • Micro CT

    ASJC Scopus subject areas

    • Materials Science(all)

    Cite this

    Yokota, M., Cho, S. H., Ito, M., Owada, S., & Kaneko, K. (2010). Microscopic Analysis of Dynamic Loading-induced Fractures by Using Micro CT. In Advances in X-ray Tomography for Geomaterials (pp. 237-243). Wiley-ISTE. https://doi.org/10.1002/9780470612187.ch22