Microstructure and magnetic properties of Co/Pd multilayered thin films with C or Si seedlayer

T. Onoue, Toru Asahi, K. Kuramochi, J. Kawaji, Tetsuya Osaka, J. Ariake, K. Ouchi, G. Sáfrán, N. Yaguchi

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

Microstructure and magnetic properties of sputter deposited Co/Pd multilayered perpendicular magnetization films with amorphous C or Si seedlayer were investigated. The angstrom scale surface roughness of the seedlayer causes fine crystal grains to form in the Co/Pd multilayer and to decrease the extent of intergranular exchange coupling, while it obstructs the formation of a regular interface between Co and Pd layers. The Si seedlayer, which exhibits a surface roughness lower than the C seedlayer, yields Co/Pd multilayered films with the lowest intergranular exchange coupling and the highest coercivity. The improvement in magnetic properties of the Co/Pd film with Si seedlayer is attributable mainly to the formation of Pd 2Si at the interface between the Co/Pd layer and the Si seedlayer. The Pd 2Si provides suitable nucleation sites for the grain growth of Co/Pd multilayered film that can be utilized as a perpendicular magnetic recording medium.

Original languageEnglish
Pages (from-to)4545-4552
Number of pages8
JournalJournal of Applied Physics
Volume92
Issue number8
DOIs
Publication statusPublished - 2002 Oct 15

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magnetic properties
microstructure
thin films
surface roughness
magnetic recording
coercivity
nucleation
magnetization
causes
crystals

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Microstructure and magnetic properties of Co/Pd multilayered thin films with C or Si seedlayer. / Onoue, T.; Asahi, Toru; Kuramochi, K.; Kawaji, J.; Osaka, Tetsuya; Ariake, J.; Ouchi, K.; Sáfrán, G.; Yaguchi, N.

In: Journal of Applied Physics, Vol. 92, No. 8, 15.10.2002, p. 4545-4552.

Research output: Contribution to journalArticle

Onoue, T, Asahi, T, Kuramochi, K, Kawaji, J, Osaka, T, Ariake, J, Ouchi, K, Sáfrán, G & Yaguchi, N 2002, 'Microstructure and magnetic properties of Co/Pd multilayered thin films with C or Si seedlayer', Journal of Applied Physics, vol. 92, no. 8, pp. 4545-4552. https://doi.org/10.1063/1.1506420
Onoue, T. ; Asahi, Toru ; Kuramochi, K. ; Kawaji, J. ; Osaka, Tetsuya ; Ariake, J. ; Ouchi, K. ; Sáfrán, G. ; Yaguchi, N. / Microstructure and magnetic properties of Co/Pd multilayered thin films with C or Si seedlayer. In: Journal of Applied Physics. 2002 ; Vol. 92, No. 8. pp. 4545-4552.
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AU - Kawaji, J.

AU - Osaka, Tetsuya

AU - Ariake, J.

AU - Ouchi, K.

AU - Sáfrán, G.

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