Microstructure and magnetic properties of SmCo5 thin films deposited on Cu and Pt underlayers

Y. K. Takahashi*, T. Ohkubo, K. Hono

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

41 Citations (Scopus)

Abstract

The microstructure of the SmCo5 thin films sputter deposited on Cu underlayers was investigated to explain the high coercivity Hc. Energy filtered elemental map and energy dispersive x-ray spectroscopy line analysis showed that Cu diffused into the SmCo5 layer to form a Sm(Co,Cu)5 solid solution. Composition fluctuations with a scale length of 40 nm were found within the Sm(Co,Cu)5 layer, which would cause the local changes in the magnetocrystalline anisotropy. The high coercivity that was observed in the continuous Sm(Co,Cu)5 layer may be attributed to the pinning force for the magnetic domain wall motion due to the fluctuation of the magnetocrystalline anisotropy. The structure and magnetic properties of the SmCo5 thin film deposited on a Pt underlayer were also examined for comparison.

Original languageEnglish
Article number053913
JournalJournal of Applied Physics
Volume100
Issue number5
DOIs
Publication statusPublished - 2006
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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