Microstructure study of CoCrPt/Ti/NiAl perpendicular media

Y. Ikeda; Y. Sonobe; G. Zeltzer; B. K. Yen; K. Takano; H. Do; P. Rice

doi:10.1016/S0304-8853(01)00308-0

Microstructure study of CoCrPt/Ti/NiAl perpendicular media

Y. Ikeda^*, Y. Sonobe, G. Zeltzer, B. K. Yen, K. Takano, H. Do, P. Rice

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Abstract

Perpendicular medium with an average grain size of 8.2nm with 20nm thickness has been produced by using a-CoCrPt/Ti/NiAl tri-layer structure. The signal-to-noise ratio improves with the addition of a NiAl seed layer. From the TEM image analysis, the introduction of the NiAl seed layer may enhance the separation between the CoCrPt grains. The ultra-small grain size will improve the performance of perpendicular media for future high-density recording applications.

Original language	English
Pages (from-to)	104-109
Number of pages	6
Journal	Journal of Magnetism and Magnetic Materials
Volume	235
Issue number	1-3
DOIs	https://doi.org/10.1016/S0304-8853(01)00308-0
Publication status	Published - 2001 Oct
Externally published	Yes
Event	Proceedings of the 5th Perpendicular Magnetic Recording Conference (PMRC 2000) - Sendai, Japan Duration: 2000 Oct 23 → 2000 Oct 26

Keywords

Perpendicular recording media
Transmission electron microscopy

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1016/S0304-8853(01)00308-0

Cite this

@article{78103034333c45b1b2ab674230d5d412,

title = "Microstructure study of CoCrPt/Ti/NiAl perpendicular media",

abstract = "Perpendicular medium with an average grain size of 8.2nm with 20nm thickness has been produced by using a-CoCrPt/Ti/NiAl tri-layer structure. The signal-to-noise ratio improves with the addition of a NiAl seed layer. From the TEM image analysis, the introduction of the NiAl seed layer may enhance the separation between the CoCrPt grains. The ultra-small grain size will improve the performance of perpendicular media for future high-density recording applications.",

keywords = "Perpendicular recording media, Transmission electron microscopy",

author = "Y. Ikeda and Y. Sonobe and G. Zeltzer and Yen, {B. K.} and K. Takano and H. Do and P. Rice",

year = "2001",

month = oct,

doi = "10.1016/S0304-8853(01)00308-0",

language = "English",

volume = "235",

pages = "104--109",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

publisher = "Elsevier",

number = "1-3",

note = "Proceedings of the 5th Perpendicular Magnetic Recording Conference (PMRC 2000) ; Conference date: 23-10-2000 Through 26-10-2000",

}

TY - JOUR

T1 - Microstructure study of CoCrPt/Ti/NiAl perpendicular media

AU - Ikeda, Y.

AU - Sonobe, Y.

AU - Zeltzer, G.

AU - Yen, B. K.

AU - Takano, K.

AU - Do, H.

AU - Rice, P.

PY - 2001/10

Y1 - 2001/10

N2 - Perpendicular medium with an average grain size of 8.2nm with 20nm thickness has been produced by using a-CoCrPt/Ti/NiAl tri-layer structure. The signal-to-noise ratio improves with the addition of a NiAl seed layer. From the TEM image analysis, the introduction of the NiAl seed layer may enhance the separation between the CoCrPt grains. The ultra-small grain size will improve the performance of perpendicular media for future high-density recording applications.

AB - Perpendicular medium with an average grain size of 8.2nm with 20nm thickness has been produced by using a-CoCrPt/Ti/NiAl tri-layer structure. The signal-to-noise ratio improves with the addition of a NiAl seed layer. From the TEM image analysis, the introduction of the NiAl seed layer may enhance the separation between the CoCrPt grains. The ultra-small grain size will improve the performance of perpendicular media for future high-density recording applications.

KW - Perpendicular recording media

KW - Transmission electron microscopy

UR - http://www.scopus.com/inward/record.url?scp=0035476772&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035476772&partnerID=8YFLogxK

U2 - 10.1016/S0304-8853(01)00308-0

DO - 10.1016/S0304-8853(01)00308-0

M3 - Conference article

AN - SCOPUS:0035476772

VL - 235

SP - 104

EP - 109

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

SN - 0304-8853

IS - 1-3

T2 - Proceedings of the 5th Perpendicular Magnetic Recording Conference (PMRC 2000)

Y2 - 23 October 2000 through 26 October 2000

ER -

Microstructure study of CoCrPt/Ti/NiAl perpendicular media

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this