Microstructure study of CoCrPt/Ti/NiAl perpendicular media

Y. Ikeda*, Y. Sonobe, G. Zeltzer, B. K. Yen, K. Takano, H. Do, P. Rice

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

3 Citations (Scopus)

Abstract

Perpendicular medium with an average grain size of 8.2nm with 20nm thickness has been produced by using a-CoCrPt/Ti/NiAl tri-layer structure. The signal-to-noise ratio improves with the addition of a NiAl seed layer. From the TEM image analysis, the introduction of the NiAl seed layer may enhance the separation between the CoCrPt grains. The ultra-small grain size will improve the performance of perpendicular media for future high-density recording applications.

Original languageEnglish
Pages (from-to)104-109
Number of pages6
JournalJournal of Magnetism and Magnetic Materials
Volume235
Issue number1-3
DOIs
Publication statusPublished - 2001 Oct
Externally publishedYes
EventProceedings of the 5th Perpendicular Magnetic Recording Conference (PMRC 2000) - Sendai, Japan
Duration: 2000 Oct 232000 Oct 26

Keywords

  • Perpendicular recording media
  • Transmission electron microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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